Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope

1999 ◽  
Author(s):  
Chi W. Yang ◽  
Din Ping Tsai ◽  
Howard E. Jackson
Keyword(s):  
Optical Waveguide ◽  
Near Field ◽  
Optical Microscope ◽  
Tapping Mode ◽  
Near Field Scanning

Imaging local index variations in an optical waveguide using a tapping-mode near-field scanning optical microscope

1999 ◽  
Vol 75 (8) ◽  
pp. 1039-1041 ◽  
Author(s):  
Din Ping Tsai ◽  
Chi Wen Yang ◽  
Shu-Zee Lo ◽  
Howard E. Jackson
Keyword(s):  
Optical Waveguide ◽  
Near Field ◽  
Optical Microscope ◽  
Local Index ◽  
Tapping Mode ◽  
Near Field Scanning

Special near-field scanning optical microscope for the measurement of optical waveguide devices

2003 ◽  
Author(s):  
Won-soo Ji ◽  
DaeChan Kim ◽  
Seung Gol Lee ◽  
Beom-Hoan O ◽  
Segeon Park ◽  
...  
Keyword(s):  
Optical Waveguide ◽  
Near Field ◽  
Optical Microscope ◽  
Waveguide Devices ◽  
Near Field Scanning

scholarly journals A Tapping-Mode Tuning Fork with a Short Fibre Probe Sensor for a Near-Field Scanning Optical Microscope

2002 ◽  
Vol 19 (9) ◽  
pp. 1268-1270 ◽  
Author(s):  
Wang Pei ◽  
Lu Yong-Hua ◽  
Zhang Jiang-Ying ◽  
Ming Hai ◽  
Xie Jian-Ping ◽  
...  
Keyword(s):  
Tuning Fork ◽  
Near Field ◽  
Optical Microscope ◽  
Short Fibre ◽  
Tapping Mode ◽  
Fibre Probe ◽  
Near Field Scanning ◽  
Probe Sensor

DESIGN AND CONSTRUCTION OF A SHORT-TIP TAPPING-MODE TUNING FORK NEAR-FIELD SCANNING OPTICAL MICROSCOPE

2003 ◽  
Vol 02 (04n05) ◽  
pp. 225-230
Author(s):  
CHIEN-WEN HUANG ◽  
NIEN-HUA LU ◽  
CHIH-YEN CHEN ◽  
CHENG-FENG YU ◽  
TSUNG-SHENG KAO ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Tuning Fork ◽  
Near Field ◽  
Single Mode ◽  
Optical Microscope ◽  
Sensing Element ◽  
Tapping Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Design And Construction

The design and construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides a stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples. We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on the endfaces of a single mode telecommunication optical fiber and a silica-based buried channel waveguide.

scholarly journals Implementation of a short-tip tapping-mode tuning fork near-field scanning optical microscope

2003 ◽  
Vol 209 (3) ◽  
pp. 205-208 ◽  
Author(s):  
N. H. Lu ◽  
C. W. Huang ◽  
C. Y. Chen ◽  
C. F. Yu ◽  
T. S. Kao ◽  
...  
Keyword(s):  
Tuning Fork ◽  
Near Field ◽  
Optical Microscope ◽  
Tapping Mode ◽  
Near Field Scanning

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

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