Comparative investigation of high-resolution transmission electron microscopy and Fourier transform infrared spectroscopy for GaN films on sapphire substrate
1996 ◽
Vol 63
(1)
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pp. 33-39
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1987 ◽
Vol 83
(5)
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pp. 1417
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2021 ◽
pp. 454-463
2018 ◽
Vol 32
(10)
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pp. 10616-10627
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1993 ◽
Vol 89
(1)
◽
pp. 135
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1985 ◽
Vol 181
(3)
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pp. 183-188
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