Knife-edge test for characterization of subnanometer deformations in micro-optical surfaces

1999 ◽  
Author(s):  
Frederic Zamkotsian ◽  
Kjetil Dohlen ◽  
Patrick Lanzoni ◽  
Silvio P. Mazzanti ◽  
Marie-Laurence Michel ◽  
...  
Keyword(s):  
Knife Edge ◽  
Optical Surfaces

scholarly journals Characterization of all second-order nonlinear-optical coefficients of organic N-benzyl-2-methyl-4-nitroaniline crystal

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Takashi Notake ◽  
Masahiro Takeda ◽  
Shuji Okada ◽  
Takuya Hosobata ◽  
Yutaka Yamagata ◽  
...  
Keyword(s):  
Nonlinear Optical ◽  
Organic Materials ◽  
Second Order ◽  
Organic N ◽  
Application Study ◽  
Optical Surfaces ◽  
Nlo Property ◽  
Diamond Blade ◽  
First Time

Abstract Full elements of second-order nonlinear optical (NLO) tensor can be completely characterized for an organic NLO crystal for the first time. As-grown bulk N-benzyl-2-methyl-4-nitroaniline (BNA) crystal was processed to expose (100) and (010) crystal orientations with fine optical surfaces by using precision lathe and diamond blade. Then, every five nonvanishing second-order NLO coefficient of BNA can be determined quantitatively using the precisely processed crystals based on 1st-kind Maker fringe measurements. Our method makes it possible to clarify uncertain NLO property of any organic materials and to accelerate application study via precise device fabrications even for fragile organic materials.

An Empirical Study of Boss/Seat Materials and Geometries for Ultra Low-Leakage MEMS Micro-Valves

2005 ◽  
Author(s):  
Bernard A. Lynch ◽  
Brian G. Jamieson ◽  
Patrick A. Roman ◽  
Charles M. Zakrzwski
Keyword(s):  
Soft Materials ◽  
Knife Edge ◽  
Parylene C ◽  
Test Fixture ◽  
Low Leakage ◽  
Sealing Capacity ◽  
Ring Configuration ◽  
Sealing Pressure ◽  
Set Up

We report work on the testing and characterization of the sealing properties of various micro-valve seat/boss interfaces. Using a custom test set-up, we have measured helium leak rates for a variety of boss materials and seat geometries. The seat geometries are micro-machined in silicon, and an orifice is DRIE etched through the chip. The test fixture allows for leak-tight edge sealing of seat chips against a viton o-ring, independent of the force used to seal the boss against the seat. Bosses are sealed against the various seat chips with forces up to 400 mN by using a precision micrometer to deflect a small spring that is coupled to the boss chip. Soft metals, such as copper and gold, and polymers such as polydimethylsiloxane (PDMS) and parylene-c, coated on silicon boss chips have been tested on hard silicon seats. In all cases, leak rates were determined as a function of sealing pressure. Seat geometries include a concentric o-ring configuration, and a silicon knife-edge. Both seats have orifice diameters varying from 60 to 110 μm. Experimental results indicate that practical MEMS-scale forces (up to several hundred mN) are sufficient to cause deformation of the soft materials coating the bosses given the small loading area, which can improve sealing capacity but not repeatability. However, uneven loading of the boss prevented a tight seal across the entire seat, which is reflected in the leak rates detected. Soft boss-materials, like PDMS, however, have shown promising results for obtaining ultra-low leak rates. Leak rates as low as 1 × 10−4 atm·cc/sec were obtained on knife-edge seats with 110 μm diameter orifices.

Fabrication and Characterization of Diamond-Like Carbon Coated Knife Edge Field Emitter Array

1996 ◽  
Vol 35 (Part 2, No. 10A) ◽  
pp. L1305-L1307 ◽  
Author(s):  
Chang Gi Ko ◽  
Byeong Kwon Ju ◽  
Yun Hi Lee ◽  
Jung Ho Park ◽  
Myung Hwan Oh
Keyword(s):  
Diamond Like Carbon ◽  
Knife Edge ◽  
Field Emitter ◽  
Edge Field ◽  
Carbon Coated ◽  
Emitter Array ◽  
Fabrication And Characterization ◽  
Field Emitter Array

scholarly journals Edge clustered fitting grids for φ-polynomial characterization of freeform optical surfaces

2011 ◽  
Vol 19 (27) ◽  
pp. 26962 ◽  
Author(s):  
Ilhan Kaya ◽  
Kevin P. Thompson ◽  
Jannick P. Rolland
Keyword(s):  
Optical Surfaces
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