Absolute measurement of surface profiles with phase-shifting projected fringe profilometry

1999 ◽  
Author(s):  
Hongyu Liu ◽  
Benjamin A. Bard ◽  
Guowen Lu ◽  
Shudong Wu
Keyword(s):  
Absolute Measurement ◽  
Phase Shifting ◽  
Surface Profiles

Absolute measurement for optical inhomogeneity of parallel plate using phase-shifting interferometry

2016 ◽  
Vol 55 (12) ◽  
pp. 124103
Author(s):  
Donghui Zheng ◽  
Lei Chen ◽  
Qinyuan Sun ◽  
Wenhua Zhu ◽  
Jinpeng Li ◽  
...  
Keyword(s):  
Parallel Plate ◽  
Absolute Measurement ◽  
Phase Shifting ◽  
Optical Inhomogeneity ◽  
Phase Shifting Interferometry

scholarly journals Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry

Sensors ◽  
2019 ◽  
Vol 19 (23) ◽  
pp. 5094 ◽  
Author(s):  
Jun Woo Jeon ◽  
Ki-Nam Joo
Keyword(s):  
Smooth Surface ◽  
Surface Profile ◽  
Phase Shifting ◽  
Single Shot ◽  
Spatial Phase ◽  
Phase Shifting Interferometry ◽  
Large Step ◽  
Measurement Results ◽  
Surface Profiles ◽  
Good Agreement

In this investigation, we propose an effective method to measure 3D surface profiles of specimens with single-shot imaging. Based on the two-wavelength interferometric principle and spatial phase-shifting technique using a polarization pixelated camera, the proposed system can not only rapidly measure the phase, but also overcome the 2π-ambiguity problem of typical phase-shifting interferometry. The rough surface profile can be calculated by the visibility of the interference fringe and can compensate for the height discontinuity by phase jumps occurring in a fine height map. An inclined plane mirror and a step height specimen with 9 μm were used for the validation of capability of measuring continuously smooth surface and large step heights. The measurement results were in good agreement with the results of typical two-wavelength interferometry.

Polishing process effect on the image of dispersed precipitates

1984 ◽  
Vol 42 ◽  
pp. 534-535
Author(s):  
C.T. Hu ◽  
C.W. Allen
Keyword(s):  
Matrix Material ◽  
Specimen Preparation ◽  
Second Phase ◽  
Precipitate Particle ◽  
Polishing Process ◽  
Second Phase Particles ◽  
The Matrix ◽  
Surface Profiles ◽  
Thinning Process

One important problem in determination of precipitate particle size is the effect of preferential thinning during TEM specimen preparation. Figure 1a schematically represents the original polydispersed Ni3Al precipitates in the Ni rich matrix. The three possible type surface profiles of TEM specimens, which result after electrolytic thinning process are illustrated in Figure 1b. c. & d. These various surface profiles could be produced by using different polishing electrolytes and conditions (i.e. temperature and electric current). The matrix-preferential-etching process causes the matrix material to be attacked much more rapidly than the second phase particles. Figure 1b indicated the result. The nonpreferential and precipitate-preferential-etching results are shown in Figures 1c and 1d respectively.

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