Laser-beam-induced current technique as a quantitative tool for HgCdTe photodiode characterization

1999 ◽  
Author(s):  
Charles A. Musca ◽  
David A. Redfern ◽  
John M. Dell ◽  
Lorenzo Faraone
Keyword(s):  
Laser Beam ◽  
Induced Current ◽  
Current Technique ◽  
Hgcdte Photodiode ◽  
Quantitative Tool

Laser beam induced current as a tool for HgCdTe photodiode characterisation

2000 ◽  
Vol 31 (7) ◽  
pp. 537-544 ◽  
Author(s):  
C.A Musca ◽  
D.A Redfern ◽  
J.M Dell ◽  
L Faraone
Keyword(s):  
Laser Beam ◽  
Induced Current ◽  
Hgcdte Photodiode

A precision method for laser focusing on laser beam induced current experiments

2002 ◽  
Vol 73 (11) ◽  
pp. 3895-3900 ◽  
Author(s):  
J. A. Poce-Fatou ◽  
J. Martı́n ◽  
R. Alcántara ◽  
C. Fernández-Lorenzo
Keyword(s):  
Laser Beam ◽  
Induced Current ◽  
Precision Method ◽  
Laser Focusing

Laser beam induced current imaging of reactive ion etching induced n-type doping in HgCdTe

1998 ◽  
Vol 27 (6) ◽  
pp. 661-667 ◽  
Author(s):  
C. A. Musca ◽  
J. F. Siliquini ◽  
E. P. G. Smith ◽  
J. M. Dell ◽  
L. Faraone
Keyword(s):  
Laser Beam ◽  
Reactive Ion Etching ◽  
Induced Current ◽  
Ion Etching

scholarly journals Metrology of a Focusing Capillary Using Optical Ptychography

Sensors ◽  
2020 ◽  
Vol 20 (22) ◽  
pp. 6462
Author(s):  
Xiaojing Huang ◽  
Evgeny Nazaretski ◽  
Weihe Xu ◽  
Dean Hidas ◽  
Mark Cordier ◽  
...  
Keyword(s):  
Standard Deviation ◽  
Laser Beam ◽  
Gaussian Distribution ◽  
Capillary Surface ◽  
Functional Surfaces ◽  
Phase Profile ◽  
Reflective Optics ◽  
Focusing Property ◽  
Focused Beam ◽  
Quantitative Tool

The focusing property of an ellipsoidal monocapillary has been characterized using the ptychography method with a 405 nm laser beam. The recovered wavefront gives a 12.5×10.4μm2 focus. The reconstructed phase profile of the focused beam can be used to estimate the height error of the capillary surface. The obtained height error shows a Gaussian distribution with a standard deviation of 1.3 μm. This approach can be used as a quantitative tool for evaluating the inner functional surfaces of reflective optics, complementary to conventional metrology methods.

Investigation of degradation mechanisms of perovskite-based photovoltaic devices using laser beam induced current mapping

2015 ◽  
Author(s):  
Zhaoning Song ◽  
Suneth C. Watthage ◽  
Adam B. Phillips ◽  
Geethika K. Liyanage ◽  
Rajendra R. Khanal ◽  
...  
Keyword(s):  
Laser Beam ◽  
Induced Current ◽  
Degradation Mechanisms ◽  
Photovoltaic Devices
Sign in / Sign up

Export Citation Format

Share Document