Performance characteristics of an amorphous silicon flat-panel x-ray imaging detector

1999 ◽  
Author(s):  
Paul R. Granfors
Keyword(s):  
Amorphous Silicon ◽  
Performance Characteristics ◽  
Flat Panel ◽  
X Ray ◽  
X Ray Imaging ◽  
Imaging Detector

High resolution X-ray imaging using amorphous silicon flat-panel arrays

1999 ◽  
Vol 46 (3) ◽  
pp. 457-461 ◽  
Author(s):  
J.T. Rahn ◽  
F. Lemmi ◽  
J.P. Lu ◽  
P. Mei ◽  
R.B. Apte ◽  
...  
Keyword(s):  
High Resolution ◽  
Amorphous Silicon ◽  
Flat Panel ◽  
X Ray ◽  
X Ray Imaging

scholarly journals X-ray imaging with amorphous silicon active matrix flat-panel imagers (AMFPIs)

1997 ◽  
Author(s):  
Youcef El-Mohri ◽  
Larry E. Antonuk ◽  
Kyung-Wook Jee ◽  
Manat Maolinbay ◽  
Xiujiang Rong ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Flat Panel ◽  
Active Matrix ◽  
X Ray ◽  
X Ray Imaging ◽  
Flat Panel Imagers

Measurement of the parameters of a linear CCD structure as a one-dimensional X-ray imaging detector

1983 ◽  
Vol 208 (1-3) ◽  
pp. 427-433 ◽  
Author(s):  
M.G. Fedotov ◽  
E.A. Kuper ◽  
V.N. Litvinenko ◽  
V.E. Panchenko ◽  
V.A. Ushakov
Keyword(s):  
One Dimensional ◽  
X Ray ◽  
Linear Ccd ◽  
X Ray Imaging ◽  
Imaging Detector

Growth of thick CdTe epilayers on GaAs substrates and evaluation of CdTe/n+-GaAs heterojunction diodes for an X-ray imaging detector

2004 ◽  
Vol 33 (6) ◽  
pp. 645-650 ◽  
Author(s):  
M. Niraula ◽  
K. Yasuda ◽  
Y. Nakanishi ◽  
K. Uchida ◽  
T. Mabuchi ◽  
...  
Keyword(s):  
X Ray ◽  
Gaas Substrates ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
Heterojunction Diodes

Characterization of Fine-Pixel X-Ray Imaging Detector Array Fabricated by Using Thick Single-Crystal CdTe Layers on Si Substrates Grown by MOVPE

2019 ◽  
Vol 66 (1) ◽  
pp. 518-523
Author(s):  
Madan Niraula ◽  
Kazuhito Yasuda ◽  
Shintaro Tsubota ◽  
Taiki Yamaguchi ◽  
Junya Ozawa ◽  
...  
Keyword(s):  
Single Crystal ◽  
Detector Array ◽  
X Ray ◽  
Si Substrates ◽  
X Ray Imaging ◽  
Imaging Detector

scholarly journals High-sensitivity high-resolution X-ray imaging with soft-sintered metal halide perovskites

2021 ◽  
Vol 4 (9) ◽  
pp. 681-688
Author(s):  
Sarah Deumel ◽  
Albert van Breemen ◽  
Gerwin Gelinck ◽  
Bart Peeters ◽  
Joris Maas ◽  
...  
Keyword(s):  
High Sensitivity ◽  
Metal Halide ◽  
Detector Arrays ◽  
X Ray ◽  
Carrier Lifetimes ◽  
Sintered Metal ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
High Carrier ◽  
Halide Perovskites

AbstractTo realize the potential of artificial intelligence in medical imaging, improvements in imaging capabilities are required, as well as advances in computing power and algorithms. Hybrid inorganic–organic metal halide perovskites, such as methylammonium lead triiodide (MAPbI3), offer strong X-ray absorption, high carrier mobilities (µ) and long carrier lifetimes (τ), and they are promising materials for use in X-ray imaging. However, their incorporation into pixelated sensing arrays remains challenging. Here we show that X-ray flat-panel detector arrays based on microcrystalline MAPbI3 can be created using a two-step manufacturing process. Our approach is based on the mechanical soft sintering of a freestanding absorber layer and the subsequent integration of this layer on a pixelated backplane. Freestanding microcrystalline MAPbI3 wafers exhibit a sensitivity of 9,300 µC Gyair–1 cm–2 with a μτ product of 4 × 10–4 cm2 V–1, and the resulting X-ray imaging detector, which has 508 pixels per inch, combines a high spatial resolution of 6 line pairs per millimetre with a low detection limit of 0.22 nGyair per frame.

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