Nondestructive evaluation of surface defects by the use of photothermal electrochemical imaging

1999 ◽  
Author(s):  
Tsutomu Hoshimiya ◽  
Ken-ya Ishikawa
Keyword(s):  
Nondestructive Evaluation ◽  
Surface Defects ◽  
Electrochemical Imaging

scholarly journals Nondestructive Evaluation of FRP-Concrete Interface Bond due to Surface Defects

2019 ◽  
Vol 2019 ◽  
pp. 1-10 ◽  
Author(s):  
Nur Yazdani ◽  
Eyosias Beneberu ◽  
Mina Riad
Keyword(s):  
Nondestructive Evaluation ◽  
Surface Defects ◽  
Sample Surface ◽  
Small Scale ◽  
Bond Quality ◽  
Related Factors ◽  
Cfrp Laminates ◽  
Surface Wetness ◽  
Externally Bonded ◽  
Ground Penetrating

Carbon fiber-reinforced polymer (CFRP) laminates have been successfully used as externally bonded reinforcements for retrofitting, strengthening, and confinement of concrete structures. The adequacy of the CFRP-concrete bonding largely depends on the bond quality and integrity. The bond quality may be compromised during the CFRP installation process due to various factors. In this study, the effect of four such construction-related factors was assessed through nondestructive evaluation (NDE) methods, and quantification of the levels of CFRP debonding was achieved. The factors were surface cleanliness, surface wetness, upward vs. downward application, and surface voids. A common unidirectional CFRP was applied to small-scale concrete samples with factorial combinations. Ground-penetrating radar and thermography NDE methods were applied to detect possible disbonds at CFRP-concrete interfaces. Thermography was found to clearly detect all four factors, while the GPR was only effective for detecting the surface voids only. The thermal images overpredicted the amount of debonded CFRP areas by about 25%, possibly due to scaling errors between the thermograph and the sample surface. The maximum debonded CFRP area in any sample was about two percent of the total CFRP area. This is a negligible amount of debonding, showing that the factors considered are unlikely to significantly affect the laminate performance or any CFRP contribution to the concrete member strength or confinement.

Observation and Nondestructive Evaluation of Tilting Surface Defects by Photoacoustic Microscopy

2004 ◽  
Vol 43 (5B) ◽  
pp. 2940-2941 ◽  
Author(s):  
Haruo Endoh ◽  
Keita Inomata ◽  
Katsuhiko Miyamoto ◽  
Yoichiro Hiwatashi ◽  
Tsutomu Hoshimiya
Keyword(s):  
Nondestructive Evaluation ◽  
Surface Defects ◽  
Photoacoustic Microscopy

Defects in Crystals

1968 ◽  
Vol 26 ◽  
pp. 244-245
Author(s):  
Kenneth R. Lawless
Keyword(s):  
Electron Microscope ◽  
Point Defects ◽  
Surface Defects ◽  
Chemical Properties ◽  
Material Point ◽  
Crystal Defects ◽  
Defects In Crystals ◽  
Irradiation Effects ◽  
Normal Lattice ◽  
Line Defects

One of the most important applications of the electron microscope in recent years has been to the observation of defects in crystals. Replica techniques have been widely utilized for many years for the observation of surface defects, but more recently the most striking use of the electron microscope has been for the direct observation of internal defects in crystals, utilizing the transmission of electrons through thin samples.Defects in crystals may be classified basically as point defects, line defects, and planar defects, all of which play an important role in determining the physical or chemical properties of a material. Point defects are of two types, either vacancies where individual atoms are missing from lattice sites, or interstitials where an atom is situated in between normal lattice sites. The so-called point defects most commonly observed are actually aggregates of either vacancies or interstitials. Details of crystal defects of this type are considered in the special session on “Irradiation Effects in Materials” and will not be considered in detail in this session.

Characterization of homoepitaxial diamond films by Electron microscopy

1991 ◽  
Vol 49 ◽  
pp. 880-881
Author(s):  
D.P. Malta ◽  
S.A. Willard ◽  
R.A. Rudder ◽  
G.C. Hudson ◽  
J.B. Posthill ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Defects ◽  
Substrate Surface ◽  
Diamond Films ◽  
Chemical Vapor ◽  
Polycrystalline Diamond ◽  
Large Degree ◽  
Rf Plasma ◽  
Semiconducting Diamond

Semiconducting diamond films have the potential for use as a material in which to build active electronic devices capable of operating at high temperatures or in high radiation environments. A major goal of current device-related diamond research is to achieve a high quality epitaxial film on an inexpensive, readily available, non-native substrate. One step in the process of achieving this goal is understanding the nucleation and growth processes of diamond films on diamond substrates. Electron microscopy has already proven invaluable for assessing polycrystalline diamond films grown on nonnative surfaces.The quality of the grown diamond film depends on several factors, one of which is the quality of the diamond substrate. Substrates commercially available today have often been found to have scratched surfaces resulting from the polishing process (Fig. 1a). Electron beam-induced current (EBIC) imaging shows that electrically active sub-surface defects can be present to a large degree (Fig. 1c). Growth of homoepitaxial diamond films by rf plasma-enhanced chemical vapor deposition (PECVD) has been found to planarize the scratched substrate surface (Fig. 1b).

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