Role of stem as a high-resolution failure analysis tool for semiconductor manufacturing technologies

1999 ◽  
Author(s):  
Alastair McGibbon ◽  
Richard Boyle ◽  
Mark Redford
Keyword(s):  
High Resolution ◽  
Failure Analysis ◽  
Semiconductor Manufacturing ◽  
Analysis Tool ◽  
Manufacturing Technologies

Advantage of AFP Nanoprobing on the 28 nm Technology Failure Analysis

2013 ◽  
Author(s):  
C.Q. Chen ◽  
G.B. Ang ◽  
S.P. Zhao ◽  
Q. Alfred ◽  
N. Dayanand ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Semiconductor Manufacturing ◽  
Fault Isolation ◽  
Feature Size ◽  
Device Characterization ◽  
Advanced Technologies ◽  
Afm Imaging ◽  
Imaging Mode ◽  
Manufacturing Technologies ◽  
Level Analysis

Abstract As the rapid developments of semiconductor manufacturing technologies, the CD of the device keep shrinking. The IC devices have a smaller feature sizes and higher densities, and thus there are many challenges come up in terms of the failure analysis and localized device characterization. Besides the challenge of smaller feature size, there is another challenge as well. Some of the traditional FA method can no longer be employed on advanced technologies, such as 28nm and beyond. Quickly and successfully isolating the failed location and obtaining electrical signature of the defect has become more of a challenge, especially for the device level analysis and characterization. AFP nanoprobing system provides some solutions to advanced nodes fault isolation through its AFM imaging mode of CAFM.

Quantitative accuracy of serotonergic neurotrans-mission imaging with high-resolution 123I SPECT

2004 ◽  
Vol 43 (06) ◽  
pp. 185-189 ◽  
Author(s):  
J. T. Kuikka
Keyword(s):  
High Resolution ◽  
Scatter Correction ◽  
Region Of Interest ◽  
Binding Potential ◽  
Partial Volume ◽  
Therapeutic Drugs ◽  
Quantitative Accuracy ◽  
Critical Error ◽  
Statistical Noise

Summary Aim: Serotonin transporter (SERT) imaging can be used to study the role of regional abnormalities of neurotransmitter release in various mental disorders and to study the mechanism of action of therapeutic drugs or drugs’ abuse. We examine the quantitative accuracy and reproducibility that can be achieved with high-resolution SPECT of serotonergic neurotransmission. Method: Binding potential (BP) of 123I labeled tracer specific for midbrain SERT was assessed in 20 healthy persons. The effects of scatter, attenuation, partial volume, mis-registration and statistical noise were estimated using phantom and human studies. Results: Without any correction, BP was underestimated by 73%. The partial volume error was the major component in this underestimation whereas the most critical error for the reproducibility was misplacement of region of interest (ROI). Conclusion: The proper ROI registration, the use of the multiple head gamma camera with transmission based scatter correction introduce more relevant results. However, due to the small dimensions of the midbrain SERT structures and poor spatial resolution of SPECT, the improvement without the partial volume correction is not great enough to restore the estimate of BP to that of the true one.

Which is the role of dynamic high-resolution ultrasound (D-HRUS) in the assessment of plantar plate tears?

2008 ◽  
Vol 29 (S 1) ◽  
Author(s):  
LM Sconfienza ◽  
F Lacelli ◽  
G Grillo ◽  
G Serafini ◽  
G Garlaschi ◽  
...  
Keyword(s):  
High Resolution ◽  
Plantar Plate

High-Resolution CT in Paraquat Poisoning of the Lung: Role of Prognosis Prediction

1998 ◽  
Vol 38 (6) ◽  
pp. 1027
Author(s):  
Kyoung Suk Kim ◽  
Young Tong Kim ◽  
Eun Joo Kwon ◽  
Choung Sik Choi ◽  
Han Heag Im ◽  
...  
Keyword(s):  
High Resolution ◽  
Prognosis Prediction ◽  
High Resolution Ct ◽  
Paraquat Poisoning

Magnetic Field Imaging on Stacked Flash Memories by Laser Probing and SQUID Scanning

2017 ◽  
Author(s):  
K. Sanchez ◽  
G. Bascoul ◽  
F. Infante ◽  
N. Courjault ◽  
T. Nakamura
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Two Dimensions ◽  
Analysis Tool ◽  
Active Device ◽  
Current Path ◽  
3D Packaging ◽  
Magnetic Field Imaging ◽  
The Magnetic Field ◽  
Field Imaging

Abstract Magnetic field imaging is a well-known technique which gives the possibility to study the internal activity of electronic components in a contactless and non-invasive way. Additional data processing can convert the magnetic field image into a current path and give the possibility to identify current flow anomalies in electronic devices. This technique can be applied at board level or device level and is particularly suitable for the failure analysis of complex packages (stacked device & 3D packaging). This approach can be combined with thermal imaging, X-ray observation and other failure analysis tool. This paper will present two different techniques which give the possibility to measure the magnetic field in two dimensions over an active device. Same device and same level of current is used for the two techniques to give the possibility to compare the performance.

SEM-Based Nanoprobing on 40, 32 and 28 nm CMOS Devices Challenges for Semiconductor Failure Analysis

2013 ◽  
Author(s):  
Erik Paul ◽  
Holger Herzog ◽  
Sören Jansen ◽  
Christian Hobert ◽  
Eckhard Langer
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Failure Analysis ◽  
Case Studies ◽  
State Of The Art ◽  
Root Cause ◽  
Highly Efficient ◽  
Technology Nodes ◽  
Scanning Electron

Abstract This paper presents an effective device-level failure analysis (FA) method which uses a high-resolution low-kV Scanning Electron Microscope (SEM) in combination with an integrated state-of-the-art nanomanipulator to locate and characterize single defects in failing CMOS devices. The presented case studies utilize several FA-techniques in combination with SEM-based nanoprobing for nanometer node technologies and demonstrate how these methods are used to investigate the root cause of IC device failures. The methodology represents a highly-efficient physical failure analysis flow for 28nm and larger technology nodes.

scholarly journals The Role of High-Resolution Analytical Techniques in the Development of Functional Foods

2021 ◽  
Vol 22 (6) ◽  
pp. 3220
Author(s):  
Álvaro Fernández-Ochoa ◽  
Francisco Javier Leyva-Jiménez ◽  
María De la Luz Cádiz-Gurrea ◽  
Sandra Pimentel-Moral ◽  
Antonio Segura-Carretero
Keyword(s):  
High Resolution ◽  
Functional Foods ◽  
Intervention Studies ◽  
Analytical Techniques ◽  
Nutritional Intervention ◽  
Bioactive Properties ◽  
Metabolic Reactions ◽  
Bioactive Potential ◽  
Endogenous Metabolites

The approaches based on high-resolution analytical techniques, such as nuclear magnetic resonance or mass spectrometry coupled to chromatographic techniques, have a determining role in several of the stages necessary for the development of functional foods. The analyses of botanical extracts rich in bioactive compounds is one of the fundamental steps in order to identify and quantify their phytochemical composition. However, the compounds characterized in the extracts are not always responsible for the bioactive properties because they generally undergo metabolic reactions before reaching the therapeutic targets. For this reason, analytical techniques are also applied to analyze biological samples to know the bioavailability, pharmacokinetics and/or metabolism of the compounds ingested by animal or human models in nutritional intervention studies. In addition, these studies have also been applied to determine changes of endogenous metabolites caused by prolonged intake of compounds with bioactive potential. This review aims to describe the main types and modes of application of high-resolution analytical techniques in all these steps for functional food development.

The Entrepreneurship Educator: Understanding Role Identity

2020 ◽  
pp. 251512742097966
Author(s):  
Birgitte Wraae ◽  
Candida Brush ◽  
Shahrokh Nikou
Keyword(s):  
Role Identity ◽  
Future Research ◽  
Analysis Tool ◽  
Perceptions Of Students ◽  
Significant Research ◽  
Future Research Directions ◽  
The Relationship ◽  
Role Identity Theory ◽  
Depth Interviews

Significant research explores effectiveness of entrepreneurial curriculum, teaching innovations and programs, but less often studied is the role of entrepreneurship educators. The way that the educator sees his or her role relative to the students is of critical importance because this directly influences pedagogy choices, expectations for students and learning outcomes, as well as job satisfaction. While recent studies propose typologies characterizing pedagogical approaches of educators, few of these are based on the data from entrepreneurship educators. Framed within role identity theory, we conducted 13 in–depth interviews to examine how entrepreneurship educators perceive their role. Using the qualitative data analysis tool (NVivo), we analyzed how the relationship between their perceptions of their role and core value orientation is connected to teaching approaches. Results show that these educators view their roles as teacher-focused, network-focused, or student-focused and that these perspectives are associated with different perceptions of students’ role and learning objectives. Further, we find different levels of emphasis on roles and that personal core values are differentially linked to these roles. Implications and future research directions are discussed.

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