Characterization of ultrafast x-ray detectors at the European Synchrotron Radiation Facility

1998 ◽  
Author(s):  
Rene Wrobel ◽  
Bernard Brullot ◽  
Francois Dainciart ◽  
Jean Doublier ◽  
Jean-Francois Eloy ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
European Synchrotron Radiation Facility ◽  
X Ray

X-ray characterization of an XMM mandrel at the European Synchrotron Radiation Facility

1995 ◽  
Author(s):  
Philippe Gondoin ◽  
Andreas K. Freund ◽  
Samuel Gougeon ◽  
Daniel de Chambure ◽  
Kees van Katwijk ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
European Synchrotron Radiation Facility ◽  
X Ray

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

scholarly journals Crystallization and preliminary X-ray characterization of the 2,4′-dihydroxyacetophenone dioxygenase fromAlcaligenessp. 4HAP

2014 ◽  
Vol 70 (6) ◽  
pp. 823-826 ◽  
Author(s):  
G. Beaven ◽  
A. Bowyer ◽  
P. Erskine ◽  
S. P. Wood ◽  
A. McCoy ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Formic Acid ◽  
Molecular Oxygen ◽  
Aromatic Ring ◽  
Bond Cleavage ◽  
Its Sequence ◽  
Hydroxybenzoic Acid ◽  
X Ray

The enzyme 2,4′-dihydroxyacetophenone dioxygenase (or DAD) catalyses the conversion of 2,4′-dihydroxyacetophenone to 4-hydroxybenzoic acid and formic acid with the incorporation of molecular oxygen. Whilst the vast majority of dioxygenases cleave within the aromatic ring of the substrate, DAD is very unusual in that it is involved in C—C bond cleavage in a substituent of the aromatic ring. There is evidence that the enzyme is a homotetramer of 20.3 kDa subunits each containing nonhaem iron and its sequence suggests that it belongs to the cupin family of dioxygenases. By the use of limited chymotrypsinolysis, the DAD enzyme fromAlcaligenessp. 4HAP has been crystallized in a form that diffracts synchrotron radiation to a resolution of 2.2 Å.

scholarly journals Static Atomic Displacements in Crystalline Solid Solution Alloys

1996 ◽  
Vol 437 ◽  
Author(s):  
Gene Ice ◽  
Cullie Sparks ◽  
J. Lee Robertson ◽  
J. Ernest Epperson ◽  
Xiaogang Jiang
Keyword(s):  
Synchrotron Radiation ◽  
Crystalline Solid ◽  
Local Order ◽  
Chemical Order ◽  
X Ray ◽  
Atomic Displacements ◽  
X Ray Scattering ◽  
New Information ◽  
Z Contrast

AbstractAtom size differences induce static displacements from an average alloy lattice and play an important role in controlling alloy phase stability and properties. The details of this role however, are difficult to study; chemical order and displacements are strongly interrelated and static displacements are hard to measure. Diffuse x-ray scattering measurements with tunable-synchrotron radiation can now measure element-specific static displacements with an accuracy of ± 0.1 pm and can simultaneously measure local chemical order out to 20 shells or more. Ideal alloys for diffuse scattering analysis with synchrotron radiation, are those that have previously been the most intractable: alloys with small Z contrast, alloys with only local order and alloys with small size differences. The combination of precise characterization of local chemical order and precise measurement of static displacement provides new information that challenges existing alloy models. We report on an ongoing systematic study of static displacements in the Fe/Ni/Cr alloys and compare the observed static displacements to the static displacements predicted by current theories. The availability of more brilliant 3rd generation hard x-ray sources will greatly enhance these measurements.

Characterization of III-nitride Based Schottky UV Detectors with Wide Detectable Wavelength Range (360–10 nm) using Synchrotron Radiation

2003 ◽  
Vol 798 ◽  
Author(s):  
Atsushi Motogaito ◽  
Kazumasa Hiramatsu ◽  
Yasuhiro Shibata ◽  
Hironobu Watanabe ◽  
Hideto Miyake ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Schottky Barrier ◽  
Wavelength Range ◽  
Epitaxial Layer ◽  
Device Performance ◽  
Uv Detectors ◽  
X Ray ◽  
High Responsivity ◽  
Vacuum Uv

ABSTRACTCharacterizations of transparent Schottky barrier GaN and AlGaN UV detectors in the vacuum UV (VUV) and soft X-ray (SX) region using synchrotron radiation are described. In the GaN UV detectors, the responsivity achieved about 0.05 A/W at 95 eV (13 nm). Thus, their device performance is shown between 3.4 and 100 eV (10 and 360 nm). Furthermore, the high responsivity spectra were realized by using AlGaN Schottky UV detectors consisting of Al0.5Ga0.5N on AlN epitaxial layer.

High resolution hard X-ray photoemission using synchrotron radiation as an essential tool for characterization of thin solid films

2006 ◽  
Vol 252 (15) ◽  
pp. 5602-5606 ◽  
Author(s):  
J.J. Kim ◽  
E. Ikenaga ◽  
M. Kobata ◽  
A. Takeuchi ◽  
M. Awaji ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Thin Solid Films ◽  
X Ray ◽  
Solid Films ◽  
Essential Tool

Recent diamond single-crystal x-ray optics developments at the European Synchrotron Radiation Facility

1998 ◽  
Author(s):  
Andreas K. Freund ◽  
Jacques P. Sellschop ◽  
Konrad Lieb ◽  
Sylvain Rony ◽  
Clemens Schulze-Briese ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
European Synchrotron Radiation Facility ◽  
Diamond Single Crystal ◽  
Ray Optics ◽  
X Ray

Characterization of porosity in a 19th century painting ground by synchrotron radiation X-ray tomography

2013 ◽  
Vol 111 (1) ◽  
pp. 31-38 ◽  
Author(s):  
Claire Gervais ◽  
Jaap J. Boon ◽  
Federica Marone ◽  
Ester S. B. Ferreira
Keyword(s):  
Synchrotron Radiation ◽  
19Th Century ◽  
X Ray
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