Determination of dispersions of electro-optic coefficients and charge carrier densities of photorefractive crystals

1998 ◽  
Author(s):  
Shuoxing Dou ◽  
Juntae Kim ◽  
Jaichul Yi ◽  
Seungwoo Yi ◽  
Sungdo Cha ◽  
...  
1999 ◽  
Vol 163 (4-6) ◽  
pp. 212-216
Author(s):  
S.X. Dou ◽  
Juntae Kim ◽  
Seungwoo Yi ◽  
Jaichul Yi ◽  
Sungdo Cha ◽  
...  

2003 ◽  
Vol 296 (1) ◽  
pp. 47-56
Author(s):  
A. Maillard ◽  
S. Bahsine ◽  
G. Kugel ◽  
D. Rytz ◽  
R. S. Klein

2005 ◽  
Vol 108-109 ◽  
pp. 643-648 ◽  
Author(s):  
Marko Yli-Koski ◽  
Hele Savin ◽  
E. Saarnilehto ◽  
Antti Haarahiltunen ◽  
Juha Sinkkonen ◽  
...  

We compare SPV technique with µ−PCD for the determination of recombination activity of copper precipitates in p-Si. The copper precipitates were formed in bulk silicon through illumination at room temperature. We observed that the recombination activities of copper precipitates measured with SPV are higher than the ones measured with µ−PCD technique. However, it seems that the copper detection sensitivity is about the same with SPV and µ−PCD techniques.


2019 ◽  
Vol 27 (24) ◽  
pp. 35141 ◽  
Author(s):  
Kana A. Sumihara ◽  
Sho Okubo ◽  
Kenichi Oguchi ◽  
Makoto Okano ◽  
Hajime Inaba ◽  
...  

2010 ◽  
Vol 18 (25) ◽  
pp. 26206 ◽  
Author(s):  
Rainer Jacob ◽  
Stephan Winnerl ◽  
Harald Schneider ◽  
Manfred Helm ◽  
Marc Tobias Wenzel ◽  
...  

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