Impact of excess low-frequency noise (ELFN) in Si:As impurity band conduction (IBC) focal plane arrays for astronomical applications
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2005 ◽
Vol 52
(5)
◽
pp. 928-933
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HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-131-Pr3-134
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1999 ◽
2002 ◽
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