Improved technique for measurement of a long radius of curvature by a digital moire method

1998 ◽  
Author(s):  
Hong Zhang ◽  
Michael J. Lalor ◽  
David R. Burton
Keyword(s):  
Radius Of Curvature ◽  
Moire Method ◽  
Improved Technique ◽  
Digital Moiré

Application of the digital moiré method in fracture analysis of a cracked rubber sheet

2006 ◽  
Vol 19 (3) ◽  
pp. 241-247 ◽  
Author(s):  
Xiaolei Li ◽  
Yilan Kang ◽  
Wei Qiu ◽  
Xia Xiao
Keyword(s):  
Fracture Analysis ◽  
Rubber Sheet ◽  
Moire Method ◽  
Digital Moiré

scholarly journals Analysis of Mechanical Characteristics of Bionic Artificial Skin Using Different Suturing Patterns

2021 ◽  
Vol 2021 ◽  
pp. 1-7
Author(s):  
Tan Xiaohua ◽  
Xiao Xia ◽  
Li Qiu ◽  
Wang Lijie ◽  
Li Baizhou
Keyword(s):  
Stress Distribution ◽  
Mechanical Characteristics ◽  
Clinical Medicine ◽  
Image Process ◽  
Deformation Characteristics ◽  
Digital Image Process ◽  
Mechanical Field ◽  
Bionic Engineering ◽  
Moire Method ◽  
Digital Moiré

Artificial bionic skin material is playing an increasingly important role in the field of medicine and bionic engineering and becoming a research hotspot in many disciplines in recent years. In this work, the digital moiré method was used to measure the mechanical field of the bionic skin material under different suturing conditions. Through the digital image process, the deformation characteristics and the stress distribution near the contact area between the bionic skin material and the suture were obtained and discussed. The different healing effects caused by suturing mode were further explored, which can provide mechanical guidance for wound suturing in clinical medicine.

Application of circular and radial gratings in digital moiré method

2008 ◽  
Author(s):  
Xia Xiao ◽  
Yilan Kang ◽  
Xiaolei Li ◽  
Zhende Hou ◽  
Haoyun Tan ◽  
...  
Keyword(s):  
Moire Method ◽  
Digital Moiré

Thermal Properties Measurement of Micro-electromechanical System Sensors by Digital Moiré Method

Strain ◽  
2005 ◽  
Vol 41 (4) ◽  
pp. 157-162 ◽  
Author(s):  
H. Shang ◽  
H. Xie ◽  
X. Wang ◽  
S. Jiang ◽  
F. Dai ◽  
...  
Keyword(s):  
Thermal Properties ◽  
Electromechanical System ◽  
Moire Method ◽  
Micro Electromechanical System ◽  
Digital Moiré

Experimental Analysis of the Damage Zone around Crack Tip for Rubberlike Materials under Mode-I Fracture Condition

2013 ◽  
Vol 341-342 ◽  
pp. 283-286
Author(s):  
Xiao Lei Li ◽  
Xiao Jing Li ◽  
Jian Bing Sang ◽  
Yan Hui Qie ◽  
Yao Ping Tu ◽  
...  
Keyword(s):  
Damage Zone ◽  
Crack Tip ◽  
Soft Materials ◽  
Physical Mechanisms ◽  
Crack Tip Fields ◽  
Deformation And Fracture ◽  
Rubberlike Material ◽  
Moire Method ◽  
Digital Moiré ◽  
Rubberlike Materials

Studying the deformation and fracture properties of soft materials can not only provide insight into the physical mechanisms underlying their superior properties and functions but also benefit the design and fabrication of rubberlike materials. In this paper, an application of the experimental digital moire method to determine the damage zone around crack tip for rubberlike material is presented. The measurement principles and the basic procedures of the method are explained in detail. The deformation of crack tip fields in the damage zones is analyzed using the sector division mode. Finally, an analysis of the damage zone is proposed to describe crack-tip fields in rubber-like materials with large deformation.

Field ion microscopy

1988 ◽  
Vol 46 ◽  
pp. 434-435
Author(s):  
Gert Ehrlich
Keyword(s):  
Low Temperature ◽  
Sample Surface ◽  
Low Pressure ◽  
Radius Of Curvature ◽  
Field Ion Microscopy ◽  
Phosphor Screen ◽  
Ion Microscopy ◽  
Field Ion Microscope

The field ion microscope, devised by Erwin Muller in the 1950's, was the first instrument to depict the structure of surfaces in atomic detail. An FIM image of a (111) plane of tungsten (Fig.l) is typical of what can be done by this microscope: for this small plane, every atom, at a separation of 4.48Å from its neighbors in the plane, is revealed. The image of the plane is highly enlarged, as it is projected on a phosphor screen with a radius of curvature more than a million times that of the sample. Müller achieved the resolution necessary to reveal individual atoms by imaging with ions, accommodated to the object at a low temperature. The ions are created at the sample surface by ionization of an inert image gas (usually helium), present at a low pressure (< 1 mTorr). at fields on the order of 4V/Å.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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