Microwave detection system for locating hemorrhage sites within the cranium and other regions

1998 ◽  
Author(s):  
Ronald G. Riechers, Sr. ◽  
Krishna M. Pasala ◽  
Geoffrey S. F. Ling
Keyword(s):  
Detection System ◽  
Microwave Detection

scholarly journals A microwave detection system for scanning electron microscopy

Scanning ◽  
1990 ◽  
Vol 12 (6) ◽  
pp. 337-338 ◽  
Author(s):  
A. E. Luk'yanov ◽  
A. A. Patrin ◽  
A. M. Yanchenko
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Detection System ◽  
Microwave Detection ◽  
Scanning Electron

A practical microwave detection system using a high-impedance microbridge and a miniature refrigerator

1993 ◽  
Vol 3 (1) ◽  
pp. 2156-2159
Author(s):  
M. Takai ◽  
K. Niki ◽  
T. Ikemachi ◽  
S. Yoshikawa ◽  
Y. Yoshisato ◽  
...  
Keyword(s):  
Detection System ◽  
High Impedance ◽  
Microwave Detection

Atmospheric pressure helium microwave detection system for gas chromatography

1978 ◽  
Vol 50 (14) ◽  
pp. 2112-2118 ◽  
Author(s):  
Bruce D. Quimby ◽  
Peter C. Uden ◽  
Ramon M. Barnes
Keyword(s):  
Gas Chromatography ◽  
Atmospheric Pressure ◽  
Detection System ◽  
Microwave Detection

Analysis of electron-diffraction intensity profiles using a photodiode-array detection system

1983 ◽  
Vol 41 ◽  
pp. 322-323
Author(s):  
J. B. Warren
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Detection System ◽  
High Energy ◽  
Photographic Emulsion ◽  
Diffraction Intensity ◽  
Silicon Photodiode ◽  
Photodiode Array Detection ◽  
Analog To Digital ◽  
Photodiode Array

Electron diffraction intensity profiles have been used extensively in studies of polycrystalline and amorphous thin films. In previous work, diffraction intensity profiles were quantitized either by mechanically scanning the photographic emulsion with a densitometer or by using deflection coils to scan the diffraction pattern over a stationary detector. Such methods tend to be slow, and the intensities must still be converted from analog to digital form for quantitative analysis. The Instrumentation Division at Brookhaven has designed and constructed a electron diffractometer, based on a silicon photodiode array, that overcomes these disadvantages. The instrument is compact (Fig. 1), can be used with any unmodified electron microscope, and acquires the data in a form immediately accessible by microcomputer.Major components include a RETICON 1024 element photodiode array for the de tector, an Analog Devices MAS-1202 analog digital converter and a Digital Equipment LSI 11/2 microcomputer. The photodiode array cannot detect high energy electrons without damage so an f/1.4 lens is used to focus the phosphor screen image of the diffraction pattern on to the photodiode array.

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