Characterization of an ultrasmall-pore microchannel plate

1997 ◽  
Author(s):  
Bruce N. Laprade ◽  
Raymond C. Cochran ◽  
Francis Langevin ◽  
Mark W. Dykstra
Keyword(s):  
Microchannel Plate

Thermal characterization of resistance and gain of microchannel plate (MCP) detectors for the JENI experiment

2019 ◽  
Vol 11 (4) ◽  
pp. 597-605 ◽  
Author(s):  
O. B. Chassela ◽  
A. Grigoriev ◽  
A. Fedorov ◽  
N. André ◽  
E. Le Comte ◽  
...  
Keyword(s):  
Thermal Characterization ◽  
Microchannel Plate

scholarly journals Systems-Level Characterization of Microchannel Plate Detector Assemblies, using a Pulsed sub-Picosecond Laser

2012 ◽  
Vol 37 ◽  
pp. 748-756 ◽  
Author(s):  
Matthew J. Wetstein ◽  
Bernhard Adams ◽  
Matthieu Chollet ◽  
Preston Webster ◽  
Zeke Insepov ◽  
...  
Keyword(s):  
Picosecond Laser ◽  
Microchannel Plate

Thermal characterization of high strip current microchannel plate photomultipliers

1995 ◽  
Author(s):  
Andrea Sardella ◽  
Michele Bassan ◽  
Leonardo Giudicotti ◽  
Luca Lotto ◽  
Roberto Pasqualotto
Keyword(s):  
Thermal Characterization ◽  
Microchannel Plate

Characterization of the low accelerating voltage performance of a microchannel plate based detector system for scanning microscopy

1991 ◽  
Vol 49 ◽  
pp. 364-365
Author(s):  
Raymond F. Cochran
Keyword(s):  
Detection Efficiency ◽  
Direct Analysis ◽  
Microchannel Plate ◽  
Axis Orientation ◽  
Backscattered Electrons ◽  
Low Energy Electrons ◽  
High Detection Efficiency ◽  
Voltage Performance ◽  
Beam Currents

The Galileo SEM2000 microchannel plate (MCP) detector collects onaxis symmetrical secondary electron images at accelerating voltages as low as 200 eV and beam currents less than 5 picoamps. Symmetrical images are particularly useful in metrology and for viewing features that are shielded by topology from an off-axis detector. Backscatter images from the same on-axis orientation can be obtained at accelerating voltages below 500 eV and beam currents less than 10 picoamps.The ability to image secondary and backscattered electrons in the same orientation, together with extremely high detection efficiency for low energy electrons make it a valuable tool for direct analysis of beam-sensitive or dielectric samples. Additional topographic enhancement can be obtained by A-B signal processing at accelerating voltages as low as 200 eV.

scholarly journals Characterization of Efficiency Enhancement in Microchannel Plate Detectors

1996 ◽  
Vol 06 (C5) ◽  
pp. C5-297-C5-302 ◽  
Author(s):  
S. J. Sijbrandij ◽  
A. Cerezo ◽  
B. Deconihout ◽  
T. J. Godfrey ◽  
G. D.W. Smith
Keyword(s):  
Microchannel Plate ◽  
Efficiency Enhancement

Characterization of Microchannel Plate Photomultipliers for Plasma Diagnostics

1979 ◽  
Vol 26 (1) ◽  
pp. 356-363 ◽  
Author(s):  
L. P. Hocker ◽  
P. A. Zagarino ◽  
J. Madrid ◽  
D. Simmons ◽  
B. Davis ◽  
...  
Keyword(s):  
Plasma Diagnostics ◽  
Microchannel Plate

Characterization of two‐gated microchannel plate framing cameras

1991 ◽  
Vol 62 (12) ◽  
pp. 2862-2870 ◽  
Author(s):  
B. H. Failor ◽  
D. F. Gorzen ◽  
C. J. Armentrout ◽  
G. E. Busch
Keyword(s):  
Microchannel Plate
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