Wavelet domain filtering for photon imaging systems

Author(s):  
Robert D. Nowak ◽  
Richard G. Baraniuk
1999 ◽  
Vol 8 (5) ◽  
pp. 666-678 ◽  
Author(s):  
R.D. Nowak ◽  
R.G. Baraniuk

2019 ◽  
Author(s):  
Pedro A. A. Penna ◽  
Nelson D. A. Mascarenhas

Synthetic aperture radar SAR imaging systems have a coherent processing that causes the appearance of the multiplicative speckle noise. This noise gives a granular appearance to the terrestrial surface scene impairing its interpretation. The similarity between patches approach is applied by the current state-of-the-art filters in remote sensing area. The goal of this manuscript is to present a method to transform the non-local means (NLM) algorithm capable to mitigate the noise. Singlelook speckle and the NLM under the Haar wavelet domain are considered in our research with intensity SAR images. To achieve our goal, we used the Exponential-Polynomial (EP) and Gamma distributions to describe the Haar coefficients. Also, stochastic distances based on these two mentioned distributions were formulated and embedded in the original NLM technique. Finally, we present analyses and comparisons of real scenarios to demonstrate the competitive performance of the proposed method with some recent filters of the literature.


Author(s):  
Xiao Zhang

Polymer microscopy involves multiple imaging techniques. Speed, simplicity, and productivity are key factors in running an industrial polymer microscopy lab. In polymer science, the morphology of a multi-phase blend is often the link between process and properties. The extent to which the researcher can quantify the morphology determines the strength of the link. To aid the polymer microscopist in these tasks, digital imaging systems are becoming more prevalent. Advances in computers, digital imaging hardware and software, and network technologies have made it possible to implement digital imaging systems in industrial microscopy labs.


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