Cyclic voltametry and microwave characterization of smart materials based on polymer electrolyte composites

1997 ◽  
Author(s):  
Alan Barnes ◽  
Anthony Despotakis ◽  
T.C. P. Wong ◽  
Alan P. Anderson ◽  
Barry Chambers ◽  
...  
Keyword(s):  
Polymer Electrolyte ◽  
Smart Materials ◽  
Cyclic Voltametry ◽  
Microwave Characterization

WGM DIELECTRIC RESONATOR WITH CAPILLARY FOR MICROWAVE CHARACTERIZATION OF LIQUIDS

2019 ◽  
Vol 78 (18) ◽  
pp. 1651-1657
Author(s):  
Alexey Gubin ◽  
A. A. Lavrinovich ◽  
I. А. Protsenko ◽  
A. A. Barannik ◽  
S. Vitusevich
Keyword(s):  
Dielectric Resonator ◽  
Microwave Characterization

Microwave Characterization of Nickel

PIERS Online ◽  
2008 ◽  
Vol 4 (6) ◽  
pp. 686-690 ◽  
Author(s):  
Stepan Lucyszyn
Keyword(s):  
Microwave Characterization

scholarly journals Microwave Characterization of Conductive PLA and its Application to a 12 to 18 GHz 3-D Printed Rotary Vane Attenuator

IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Enrique Marquez-Segura ◽  
Sang-Hee Shin ◽  
Attique Dawood ◽  
Nick Ridler ◽  
Stepan Lucyszyn
Keyword(s):  
Microwave Characterization

Microwave characterization of undoped polycrystalline silicon

2006 ◽  
Vol 35 (6) ◽  
pp. 350-353
Author(s):  
P. A. Borodovskii ◽  
A. F. Buldygin ◽  
A. T. Drofa ◽  
A. S. Tokarev
Keyword(s):  
Polycrystalline Silicon ◽  
Microwave Characterization

Thermal and microwave characterization of GaAs to Si metal-bonded structures

2013 ◽  
Vol 114 (12) ◽  
pp. 123515
Author(s):  
Justin R. Bickford ◽  
P. K. L. Yu ◽  
S. S. Lau
Keyword(s):  
Microwave Characterization

scholarly journals Characterization of Sputtered Shape Memory Alloy Ni-Ti Films by Cross-sectional TEM and SEM

2008 ◽  
Vol 14 (S3) ◽  
pp. 85-86
Author(s):  
R.M.S. Martins ◽  
A. Mücklich ◽  
N. Schell ◽  
R.J.C. Silva ◽  
K.K. Mahesh ◽  
...  
Keyword(s):  
Thin Films ◽  
Shape Memory ◽  
Smart Materials ◽  
Functionally Graded ◽  
Sensors And Actuators ◽  
Successful Development ◽  
Cross Sectional ◽  
Mechanical Devices ◽  
Ti Films

Ni-Ti Shape Memory Alloys (SMAs) have been attracting attention as smart materials because they can work as sensors and actuators at the same time. Miniaturization of mechanical devices is evolving toward sub-micron dimensions raising important questions in the properties of Ni-Ti films. In thin films it is essential to investigate the microstructure to understand the origin of the thickness limit. The design of functionally graded films has also been considered but for their successful development it is important to characterize the variations in crystalline structure.

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