Temperature sensitivity of strained multiple quantum well long-wavelength semiconductor lasers: root cause analysis and the effects of varying device structure

Author(s):  
John D. Evans ◽  
John G. Simmons ◽  
Toshi Makino
2000 ◽  
Author(s):  
William J. Siskaninetz ◽  
Hank D. Jackson ◽  
James E. Ehret ◽  
Jeffrey C. Wiemeri ◽  
John P. Loehr

1999 ◽  
Vol 38 (Part 1, No. 6A) ◽  
pp. 3530-3534
Author(s):  
Mitsuaki Shimizu ◽  
Yoshihiro Suzuki ◽  
Seiji Mukai ◽  
Masanobu Watanabe ◽  
Toshifumi Hasama

1989 ◽  
Vol 54 (22) ◽  
pp. 2174-2176 ◽  
Author(s):  
J. Z. Wilcox ◽  
S. Ou ◽  
J. J. Yang ◽  
M. Jansen ◽  
G. L. Peterson

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