Gated MCP framing camera system

1997 ◽  
Author(s):  
Aurelia Secroun ◽  
Alain Mens ◽  
Jacques Segre ◽  
Franck Assous ◽  
Emmanuel Piault ◽  
...  
Keyword(s):  
Camera System ◽  
Framing Camera

Development of single frame and double-channel X-ray framing camera system for SG-Ⅲ laser facility

2014 ◽  
Vol 26 (10) ◽  
pp. 102001
Author(s):  
李晋 Li Jin ◽  
杨志文 Yang Zhiwen ◽  
杨品 Yang Pin ◽  
杨正华 Yang Zhenghua ◽  
董建军 Dong Jianjun ◽  
...  
Keyword(s):  
Camera System ◽  
X Ray ◽  
Single Frame ◽  
Laser Facility ◽  
Double Channel ◽  
Framing Camera

3D framing camera system based on sample cumulation method

2007 ◽  
Author(s):  
Yanbing Jiang ◽  
Huiming Yan ◽  
Xiuda Zhang ◽  
Long Wang ◽  
Yan Li
Keyword(s):  
Camera System ◽  
Framing Camera

A fast framing camera system for observation of acceleration and ablation of cryogenic hydrogen pellet in ASDEX Upgrade plasmas

2004 ◽  
Vol 75 (11) ◽  
pp. 4754-4762 ◽  
Author(s):  
G. Kocsis ◽  
S. Kálvin ◽  
G. Veres ◽  
P. Cierpka ◽  
P. T. Lang ◽  
...  
Keyword(s):  
Camera System ◽  
Framing Camera

scholarly journals 2D turbulence structure observed by a fast framing camera system in linear magnetized device PANTA

2017 ◽  
Vol 823 ◽  
pp. 012009
Author(s):  
Satoshi Ohdachi ◽  
Shigeru Inagaki ◽  
Tatsuya Kobayashi ◽  
Motoshi Goto
Keyword(s):  
Turbulence Structure ◽  
Camera System ◽  
2D Turbulence ◽  
Framing Camera

Simultaneous Imaging and Spectroscopy of Detonation Interaction in Reactive and Energetic Materials

2016 ◽  
Vol 71 (1) ◽  
pp. 78-86 ◽  
Author(s):  
Stephanie Johnson ◽  
Michael Clemenson ◽  
Nick Glumac
Keyword(s):  
Energetic Materials ◽  
Imaging Spectroscopy ◽  
Reactive Metal ◽  
Camera System ◽  
Imaging Spectrometer ◽  
Time Resolved ◽  
Ultrafast Imaging ◽  
Simultaneous Imaging ◽  
Imaging And Spectroscopy ◽  
Framing Camera

A dual framing camera system was coupled with custom-designed ultrafast imaging spectrometer optics to yield simultaneous imaging and imaging spectroscopy of extremely short detonation interaction events in reactive materials. For short exposures of 100 ns or less, spectral resolutions of 2.4 Å are achievable, allowing for time-resolved identification of key intermediate species evolving from prompt reaction. Under some circumstances, emission can be fit to a local emission temperature, assuming the optically thin limit. Applications to reactive metal systems involving aluminum, magnesium, titanium, boron, and silicon are demonstrated.

Intelligentized Soft X-Ray Picosecond Framing Camera Control System Design

2013 ◽  
Vol 655-657 ◽  
pp. 749-752
Author(s):  
Hao Yu
Keyword(s):  
Inertial Confinement Fusion ◽  
Mode Switching ◽  
Inertial Confinement ◽  
Intelligent Network ◽  
Camera System ◽  
X Ray ◽  
Confinement Fusion ◽  
Embedded Pc ◽  
The Stability ◽  
Framing Camera

In order to meet the demand of diagnostic equipment on the intelligent network testing for inertial confinement fusion (ICF) research, an intelligent X-ray framing camera system is designed and implemented. Embedded PC/104 bus masters the whole system and realizes human-machine communication and networking. The self-designed multifunction interface card can realize the camera work point setting, mode switching and environment monitoring. The specialized software and hardware make the camera has the ability of self-diagnosis and automatically adjust work point. The system improves the stability, reliability, consistency and precision of the camera. It is significant for furthering analysis the ICF issue.

Precise on-line Measurement of Lattice Vectors

1990 ◽  
Vol 48 (1) ◽  
pp. 530-531
Author(s):  
W.J. de Ruijter ◽  
Sharma Renu
Keyword(s):  
Electron Microscope ◽  
Measurement Errors ◽  
Dynamic Range ◽  
Structural Information ◽  
Statistical Parameter ◽  
Systematic Errors ◽  
Geometric Distortion ◽  
Crystal Silicon ◽  
Camera System ◽  
On Line

Established methods for measurement of lattice spacings and angles of crystalline materials include x-ray diffraction, microdiffraction and HREM imaging. Structural information from HREM images is normally obtained off-line with the traveling table microscope or by the optical diffractogram technique. We present a new method for precise measurement of lattice vectors from HREM images using an on-line computer connected to the electron microscope. It has already been established that an image of crystalline material can be represented by a finite number of sinusoids. The amplitude and the phase of these sinusoids are affected by the microscope transfer characteristics, which are strongly influenced by the settings of defocus, astigmatism and beam alignment. However, the frequency of each sinusoid is solely a function of overall magnification and periodicities present in the specimen. After proper calibration of the overall magnification, lattice vectors can be measured unambiguously from HREM images.Measurement of lattice vectors is a statistical parameter estimation problem which is similar to amplitude, phase and frequency estimation of sinusoids in 1-dimensional signals as encountered, for example, in radar, sonar and telecommunications. It is important to properly model the observations, the systematic errors and the non-systematic errors. The observations are modelled as a sum of (2-dimensional) sinusoids. In the present study the components of the frequency vector of the sinusoids are the only parameters of interest. Non-systematic errors in recorded electron images are described as white Gaussian noise. The most important systematic error is geometric distortion. Lattice vectors are measured using a two step procedure. First a coarse search is obtained using a Fast Fourier Transform on an image section of interest. Prior to Fourier transformation the image section is multiplied with a window, which gradually falls off to zero at the edges. The user indicates interactively the periodicities of interest by selecting spots in the digital diffractogram. A fine search for each selected frequency is implemented using a bilinear interpolation, which is dependent on the window function. It is possible to refine the estimation even further using a non-linear least squares estimation. The first two steps provide the proper starting values for the numerical minimization (e.g. Gauss-Newton). This third step increases the precision with 30% to the highest theoretically attainable (Cramer and Rao Lower Bound). In the present studies we use a Gatan 622 TV camera attached to the JEM 4000EX electron microscope. Image analysis is implemented on a Micro VAX II computer equipped with a powerful array processor and real time image processing hardware. The typical precision, as defined by the standard deviation of the distribution of measurement errors, is found to be <0.003Å measured on single crystal silicon and <0.02Å measured on small (10-30Å) specimen areas. These values are ×10 times larger than predicted by theory. Furthermore, the measured precision is observed to be independent on signal-to-noise ratio (determined by the number of averaged TV frames). Obviously, the precision is restricted by geometric distortion mainly caused by the TV camera. For this reason, we are replacing the Gatan 622 TV camera with a modern high-grade CCD-based camera system. Such a system not only has negligible geometric distortion, but also high dynamic range (>10,000) and high resolution (1024x1024 pixels). The geometric distortion of the projector lenses can be measured, and corrected through re-sampling of the digitized image.

Human Factors Evaluation of 360 Panoramic View Camera System for Ground Vehicle

2007 ◽  
Author(s):  
Cheng Li Wei ◽  
Ang Cher Wee ◽  
Chan Wai Herng ◽  
Ying Meng Fai
Keyword(s):  
Human Factors ◽  
Panoramic View ◽  
Camera System ◽  
Ground Vehicle

An Infrared Microscope for Use on a Focused Ion Beam for Circuit Edit and Backside Edit Applications

2015 ◽  
Author(s):  
Alexander Richards ◽  
Matthew Weschler ◽  
Michael Durller
Keyword(s):  
Focused Ion Beam ◽  
Near Infrared ◽  
Ion Beam ◽  
Visible Spectrum ◽  
Camera System ◽  
Buried Structures ◽  
Ir Camera ◽  
Area Of Interest ◽  
Near Ultraviolet ◽  
Infrared Microscope

Abstract To help solve the navigational problem, i.e., being able to successfully locate a circuit for probing or editing without destroying chip functionality, a near-infrared (NIR), near-ultraviolet (NUV), and visible spectrum camera system was developed that attaches to most focused ion beam (FIB) or scanning electron microscope vacuum chambers. This paper reviews the details of the design and implementation of the NIR/NUV camera system, as instantiated upon the FEI FIB 200, with a particular focus on its use for the visualization of buried structures, and also for non-destructive real time area of interest location and end point detection. It specifically considers the use of the micro-optical camera system for its benefit in assisting with frontside and backside circuit edit, as well as other typical FIB milling activities. The quality of the image obtained by the IR camera rivals or exceeds traditional optical based imaging microscopy techniques.

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