Possibilities of ellipsometry with surface plasmon excitation in the investigation of thin films in comparison to separated ellipsometry and surface plasmon spectroscopy
2006 ◽
Vol E89-C
(12)
◽
pp. 1758-1759
Keyword(s):
2003 ◽
Vol 42
(Part 1, No. 4B)
◽
pp. 2506-2510
◽
Keyword(s):
2015 ◽
Vol 63
(4)
◽
pp. 1765-1774
◽
2013 ◽
Vol E96.C
(3)
◽
pp. 385-388
◽