Use of the Muller matrix for calculating the polarization characteristics of semiconductor thermal emission

1997 ◽  
Author(s):  
Vasiliy A. Morozhenko ◽  
Alexej G. Kollyukh ◽  
R. Merker
Keyword(s):  
Thermal Emission ◽  
Polarization Characteristics

Solar Radio-Frequency Emission from Localized Regions at Very High Temperatures

1951 ◽  
Vol 4 (2) ◽  
pp. 131
Author(s):  
JH Piddington ◽  
HC Minnett
Keyword(s):  
Radio Frequency ◽  
Solar Radio ◽  
Thermal Emission ◽  
Thermionic Emission ◽  
Magnetic Data ◽  
Radio Frequency Radiation ◽  
Sunspot Data ◽  
Polarization Characteristics ◽  
Frequency Radiation ◽  
Three Components

Solar radio-frequency radiation is analysed into three components ; a basic steady component B, a slowly varying component S, and various forms of more or less rapid fluctuations called the X component. The spectra of all three components are drawn between 600 and 24,000 Mc/s., and suggested extensions to lower frequencies are discussed. The properties of the S component are described in some detail ; these include correlation with sunspot data, polarization, and the location of the sources of origin. Evidence is presented in favour of generation by thermal processes. It is suggested that the S component is due to thermal emission from localized regions at temperatures of about 107 �K., often in the vicinity of sunspots. The radiation from a model hot region is examined in detail and the emission spectrum and polarization characteristics are derived. The results are found to compare reasonably with observation. Thermionic emission of electrons and protons would probably occur from the hot regions. These particles would travel to the Earth with average velocities of a few hundred kilometres per second and may be identical with the slow corpuscular radiation whose presence is deduced from terrestrial magnetic data.

scholarly journals Nearly Simultaneous Optical and VLBI Polarization Observations of BL Lac Objects

1996 ◽  
Vol 175 ◽  
pp. 242-243
Author(s):  
D.C. Gabuzda ◽  
P.Y. Kochanev ◽  
M.L. Sitko ◽  
P.S. Smith
Keyword(s):  
Magnetic Field ◽  
Thermal Emission ◽  
Model Parameters ◽  
Bl Lac Objects ◽  
Synchrotron Source ◽  
Bl Lacertae ◽  
Simultaneous Measurements ◽  
Source Models ◽  
Polarization Characteristics ◽  
The Magnetic Field

The continua of BL Lacertae objects and other “blazars” are dominated by nonthermal emission that is variable and highly polarized at UV–radio wavelengths (Angel and Stockman 1980; Kollgaard 1994; Allen et al. 1993). It is believed that this non-thermal emission is associated with the relativistic jets that are known to exist in these sources, but details of the jet structure and physics are still very uncertain. It is usually expected that the polarization behavior at optical and radio wavelengths should show little or no correlation, even if genuinely simultaneous measurements are compared. It is typically thought that the emission in these two wavebands originates in vastly different parts of the source, where the magnetic field geometries are likely to be quite different. In some inhomogeneous synchrotron source models for blazars, however, depending on the model parameters considered, the radio and UV-optical-IR (UVOIR) emission may be co-spatial (Ghisellini, Maraschi & Treves (1985)). It is thus of interest to search for correlations between the emission of blazars in the UVOIR and radio, to test such models. Our approach to doing this has been to compare simultaneous measurements of the optical and VLBI polarization characteristics of compact AGN. The polarization of the radiation is effectively used as a probe of the magnetic field structures in the regions where the emission at the two wavelengths arises.

Measurement of lattice parameter at the nanometer scale using convergent-beam microdiffraction from a thermal emission source

1993 ◽  
Vol 51 ◽  
pp. 690-691
Author(s):  
W. T. Pike
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Thermal Emission ◽  
Lattice Parameter ◽  
Scanning Transmission Electron Microscope ◽  
Emission Source ◽  
Device Structure ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Convergent Beam

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.

Application of Backside Photo and Thermal Emission Microscopy Techniques to Advanced Memory Devices

1997 ◽  
Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel
Keyword(s):  
Thermal Emission ◽  
Test Cases ◽  
Memory Devices ◽  
Front Side ◽  
Emission Analysis ◽  
Intensity Attenuation ◽  
Analysis Techniques ◽  
Defect Sites ◽  
Emission Microscopy ◽  
Microscopy Techniques

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.

APPROACHES TO MODELING THERMAL EMISSION AND REFLECTANCE IN CRISM AND OMEGA OBSERVATIONS FROM 1-5 μM

2017 ◽  
Author(s):  
Kathryn E. Powell ◽  
◽  
Raymond E. Arvidson ◽  
Linyun He ◽  
Joseph A. O'Sullivan
Keyword(s):  
Thermal Emission
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