Stress-induced birefringence calibration of large aperture dynamic interferometer based on the rotation of light source polarization state

2021 ◽  
Author(s):  
XInyu Miao ◽  
Jun Ma ◽  
Caojin Yuan
Keyword(s):  
Light Source ◽  
Polarization State ◽  
Large Aperture

Development and performance of a versatile soft X-ray polarimeter

2010 ◽  
Vol 1 (SRMS-7) ◽  
Author(s):  
H. Wang ◽  
U. H. Wagner ◽  
S. S. Dhesi ◽  
K. J. S. Sawhney ◽  
F. Maccherozzi ◽  
...  
Keyword(s):  
Light Source ◽  
Rare Earths ◽  
Polarization State ◽  
Polarized Light ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
X Ray ◽  
Arbitrary Polarization ◽  
And Performance ◽  
Transmission Phase

With modern undulators generating light of an arbitrary polarization state, experiments exploiting this feature in the soft X-ray region are becoming increasingly widespread. Circularly polarized light in the soft X-ray region is of particular interest to investigate of magnetic metals such as Fe, Co and Ni, and the rare earths. A versatile multilayer polarimeter has been designed and developed to characterize the polarization state of the soft X-ray beam. A W/B4C multilayer transmission phase retarder and reflection analyser has been used for polarimetry measurements on the beamline (I06) at Diamond Light Source. The design details of the polarimeter and preliminary polarimetry results are presented.

Laser Feedback Interferometers Based on Orthogonally Polarized He-Ne Lasers

2005 ◽  
Vol 295-296 ◽  
pp. 183-188
Author(s):  
Shu Lian Zhang ◽  
Y.C. Ding
Keyword(s):  
Signal Processing ◽  
Light Source ◽  
Polarization State ◽  
Feedback Effect ◽  
Movement Direction ◽  
Threshold Intensity ◽  
Dual Frequency ◽  
Measured Object ◽  
Real Contact ◽  
The Difference

A novel unattached laser feedback interferometer by combining the laser feedback effect with the frequency splitting technology is presented and demonstrated. Light source is the birefringence dual frequency He Ne laser which generates o-light and e-light with orthogonally polarized states. When the feedback mirror is moved along the laser axis, the intensity of both o-light and e-light is changed periodically. If a threshold intensity for the output light is appropriately given by the signal processing circuits, the remaining intensity curves in each period shows four different polarization states: e-light, e-light and o-light, o-light, and no-light. Each change of polarization state corresponds to λ/8 displacement of the feedback mirror. We determine the movement direction by the difference of the order of the polarization state appearance. The resolution of the system is 0.079µm. In the experiment, the reflectivity of feedback has no influence on waveform. The laser feedback interferometer is likely to become an instrument which has no real contact with a measured object.

Design and Measurement of Radiometric Performance of Ultra-Large Aperture Uniform Light Source

2017 ◽  
Vol 44 (4) ◽  
pp. 0410003
Author(s):  
张钊 Zhang Zhao ◽  
李宪圣 Li Xiansheng ◽  
万志 Wan Zhi ◽  
孙景旭 Sun Jingxu ◽  
刘洪兴 Liu Hongxing ◽  
...  
Keyword(s):  
Light Source ◽  
Large Aperture

scholarly journals Quantitative investigation of linear arbitrary polarization in an APPLE-II undulator

2018 ◽  
Vol 25 (2) ◽  
pp. 378-384
Author(s):  
Matthew Hand ◽  
Hongchang Wang ◽  
Francesco Maccherozzi ◽  
Marco Apollonio ◽  
Jingtao Zhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Light Source ◽  
Polarization State ◽  
Measured Data ◽  
Beam Polarization ◽  
Quantitative Investigation ◽  
X Ray ◽  
The World

Insertion devices are utilized at synchrotron radiation facilities around the world for their capability to provide a high-brilliance X-ray beam. APPLE-II type undulators are especially important for their capacity to switch between a variety of photon beam polarization states. A high-precision soft X-ray polarimeter has been used to investigate the polarization calibration of an APPLE-II undulator (period length λu= 64 mm) installed on beamline I06 at Diamond Light Source. Systematic measurement of the beam polarization state at a range of linear arbitrary angles has been compared with the expected result for a given set of undulator gap and row phase parameters calculated from theory. Determination of the corresponding Stokes–Poincaré parameters from the measured data reveals a discrepancy between the two. The limited number of energy/polarization combinations included in the undulator calibration tables necessitates the use of interpolated values for the missing points which is expected to contribute to the discrepancy. However, by modifying the orbit of the electron beam through the undulator by at least 160 µm it has been found that for certain linear polarizations the discrepancies can be corrected. Overall, it is suggested that complete correction of the Stokes–Poincaré parameters for all linear angles would require alteration of both these aspects.

Spectroscopic Birefringence Mapping by Channeled Spectrum

2011 ◽  
Vol 70 ◽  
pp. 452-457
Author(s):  
Toshitaka Wakayama ◽  
Toru Yoshizawa ◽  
Yukitoshi Otani
Keyword(s):  
Light Source ◽  
White Light ◽  
Polarization State ◽  
Ccd Camera ◽  
Tunable Filter ◽  
Biomedical Science ◽  
Material Technology ◽  
White Light Source ◽  
Data Points ◽  
Visible Wavelengths

Birefringence mapping of objects has attracted great interest in the fields of material technology and biomedical science. This paper describes spectroscopic birefringence mapping using a channeled spectrum. To perform spectroscopic birefringence mapping using a microscope, an acousto-optical tunable filter (AOTF) was employed as a spectrometer. The AOTF can select a specific wavelength from a white light source. The optical arrangement consists of a white light source, the AOTF, a polarizer, two retarders with high-order retardance, two objective lenses, an analyzer, and a CCD camera. The polarizer and the first retarder can modulate the polarization state and they function as polarizing optics, while the second retarder and the analyzer can analyze the polarization state and they function as analyzing optics. A sample is inserted between the polarizing and analyzing optics. Images obtained at a specific wavelength generate 128 data points at visible wavelengths. A channeled spectrum (i.e., the intensity distribution) can be generated from the images obtained. A Fourier spectrum can be obtained by the fast Fourier transform (FFT) method. The birefringence properties of the sample can be derived by calculating the inverse FFT. We used this technique to measure the polarization properties of a nematic liquid crystal droplet.

Large Aperture Polarized Light Source and Novel Liquid Crystal Display Operating Modes

1990 ◽  
Vol 29 (Part 2, No. 4) ◽  
pp. L634-L637 ◽  
Author(s):  
S. V. Belayev ◽  
M. Schadt ◽  
M. I. Barnik ◽  
J. Fünfschilling ◽  
N. V. Malimoneko ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Light Source ◽  
Liquid Crystal Display ◽  
Polarized Light ◽  
Operating Modes ◽  
Large Aperture
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