Large thickness measurement of glass plates with a spectrally resolved interferometer using two positions of a reference surface and a compensation glass

2021 ◽  
Author(s):  
Kaining Zhang ◽  
Samuel Choi ◽  
Osami Sasaki ◽  
Songjie Luo ◽  
Takamasa Suzuki ◽  
...  
Keyword(s):  
Thickness Measurement ◽  
Reference Surface ◽  
Large Thickness ◽  
Glass Plates ◽  
Spectrally Resolved

scholarly journals Large thickness measurement of glass plates with a spectrally resolved interferometer using variable signal positions

OSA Continuum ◽  
2021 ◽  
Author(s):  
Kaining Zhang ◽  
Samuel Choi ◽  
Osami Sasaki ◽  
Songjie Luo ◽  
Takamasa Suzuki ◽  
...  
Keyword(s):  
Thickness Measurement ◽  
Large Thickness ◽  
Glass Plates ◽  
Spectrally Resolved

A dual-scanning white-light interferometer for exact thickness measurement of a large-thickness glass plate

2020 ◽  
Vol 31 (4) ◽  
pp. 045009
Author(s):  
Kaining Zhang ◽  
Osami Sasaki ◽  
Songjie Luo ◽  
Takamasa Suzuki ◽  
Yongxin Liu ◽  
...  
Keyword(s):  
White Light ◽  
Glass Plate ◽  
Thickness Measurement ◽  
Large Thickness ◽  
White Light Interferometer

Large-area full-field thickness measurement of glass plates by an optical interferometric system

2014 ◽  
Vol 333 ◽  
pp. 243-252 ◽  
Author(s):  
Po-Chi Sung ◽  
Wei-Chung Wang ◽  
Chi-Hung Hwang ◽  
Meng-Hsiu Li
Keyword(s):  
Thickness Measurement ◽  
Large Area ◽  
Full Field ◽  
Glass Plates

Non-destructive thickness measurement of dichromated gelatin films deposited on glass plates

2006 ◽  
Vol 38 (7) ◽  
pp. 552-557 ◽  
Author(s):  
R.P. Shukla ◽  
D.V. Udupa ◽  
N.C. Das ◽  
Murty V. Mantravadi
Keyword(s):  
Thickness Measurement ◽  
Gelatin Films ◽  
Dichromated Gelatin ◽  
Glass Plates ◽  
Non Destructive

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

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