scholarly journals Advanced laser sources for Sentinel-5/UVNS instrument calibration

2021 ◽  
Author(s):  
Matthew P. Edgar ◽  
John Nicholls ◽  
Gareth Maker ◽  
David Mesquita ◽  
Graeme Malcom
Keyword(s):  
Instrument Calibration ◽  
Laser Sources

Distortion in lattice-resolution scanned-probe microscope images

1993 ◽  
Vol 51 ◽  
pp. 522-523
Author(s):  
L. Fei
Keyword(s):  
Film Studies ◽  
Lattice Structure ◽  
Substrate Material ◽  
Repulsive Force ◽  
Instrument Calibration ◽  
Microscope Images ◽  
Probe Microscope ◽  
Electron Microscopes ◽  
Diffraction Patterns ◽  
Lattice Resolution

Scanned probe microscopes (SPM) have been widely used for studying the structure of a variety material surfaces and thin films. Interpretation of SPM images, however, remains a debatable subject at best. Unlike electron microscopes (EMs) where diffraction patterns and images regularly provide data on lattice spacings and angles within 1-2% and ∽1° accuracy, our experience indicates that lattice distances and angles in raw SPM images can be off by as much as 10% and ∽6°, respectively. Because SPM images can be affected by processes like the coupling between fast and slow scan direction, hysteresis of piezoelectric scanner, thermal drift, anisotropic tip and sample interaction, etc., the causes for such a large discrepancy maybe complex even though manufacturers suggest that the correction can be done through only instrument calibration.We show here that scanning repulsive force microscope (SFM or AFM) images of freshly cleaved mica, a substrate material used for thin film studies as well as for SFM instrument calibration, are distorted compared with the lattice structure expected for mica.

Prospects of development of the reference base of the Russian Federation in the field of length measurements

2020 ◽  
pp. 3-5
Author(s):  
Y. G. Zakharenko ◽  
N. A. Kononova ◽  
V. L. Fedorin ◽  
Z. V. Fomkina ◽  
K. V. Chekirda
Keyword(s):  
High Precision ◽  
Russian Federation ◽  
Reference Base ◽  
Length Measurements ◽  
Laser Sources ◽  
The Russian Federation ◽  
Unit Of Length ◽  
Further Development ◽  
532 Nm

The results of the work to create a complex of high-precision hardware for the unit of length reproduction and transferring carried out at “D. I. Mendeleyev Institute for Metrology (VNIIM)” are represented. This complex will serve as the basis for the further development of the reference base of the Russian Federation in the field of length measurements and will allow reproduction of the unit of length at two wavelengths of 633 nm and 532 nm, as well as measurements of the wavelength of laser sources in vacuum in the range from 500 to 1050 nm.

Non-Plasmonic SERS with Silicon: Is It Really Safe? New Insights into Opto-Thermics of Core/Shell Microbeads

2018 ◽  
Author(s):  
Nicolò Bontempi ◽  
Irene Vassalini ◽  
Stefano Danesi ◽  
Matteo Ferroni ◽  
Paolo Colombi ◽  
...  
Keyword(s):  
Critical Role ◽  
Raman Laser ◽  
Core Shell ◽  
Thermal Coupling ◽  
Melting Points ◽  
Experimental Proof ◽  
Weakly Coupled ◽  
Light Management ◽  
Laser Sources ◽  
First Time

<p>Here we investigate for the first time the opto-thermal behavior of SiO<sub>2</sub>/Si core/shell microbeads (Si-rex) irradiated with three common Raman laser sources (lambda=532, 633, 785 nm) under real working conditions. We obtained an experimental proof of the critical role played by bead size and aggregation in heat and light management, demonstrating that in the case of strong opto-thermal coupling the temperature can exceed that of the melting points of both core and shell components. In addition, we also show that weakly coupled beads can be utilized as stable substrates for plasmon-free SERS experiments.</p>

Laser sources in medicine

1967 ◽  
Vol 13 (12) ◽  
pp. 458
Author(s):  
T. Powell
Keyword(s):  
Laser Sources

Making Known Concentrations for Instrument Calibration

AIHAJ ◽  
1961 ◽  
Vol 22 (5) ◽  
pp. 392-402 ◽  
Author(s):  
H. N. Cotabish ◽  
P. W. McConnaughey ◽  
H. C. Messer
Keyword(s):  
Instrument Calibration

Superfluorescent laser sources based on single-wall carbon nanotube films (Conference Presentation)

2017 ◽  
Author(s):  
Zhongqu Long ◽  
Yongrui Wang ◽  
Kankan Cong ◽  
G. Timothy Noe II ◽  
Junichiro Kono ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Single Wall Carbon Nanotube ◽  
Single Wall Carbon ◽  
Laser Sources ◽  
Nanotube Films

scholarly journals The acceptable range of roughness instrument calibration factor

2021 ◽  
Vol 1816 (1) ◽  
pp. 012028
Author(s):  
A Rahman ◽  
N Alfiyati ◽  
O Novyanto ◽  
N L Kartika ◽  
R Z Amdani
Keyword(s):  
Calibration Factor ◽  
Instrument Calibration ◽  
Acceptable Range

Different modulation schemes for direct and external modulators based on various laser sources

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Hazem M. El-Hageen ◽  
P.G. Kuppusamy ◽  
Aadel M. Alatwi ◽  
M. Sivaram ◽  
Z. Ahamed Yasar ◽  
...  
Keyword(s):  
Rate Equation ◽  
Simulation Software ◽  
Optical Systems ◽  
Laser Source ◽  
Optical Link ◽  
Input And Output ◽  
Modulation Techniques ◽  
Different Types ◽  
Laser Sources ◽  
Modulation Schemes

AbstractDifferent types of laser source modulation techniques have been used in various applications depending on the objective. As optical systems extract the laws and the best solutions from experiments and simulations, the present study uses simulation software with different modulation types so the output signals can be compared. The modulators used are Mach-Zehnder, which is an external modulator, and electro-absorption modulator and laser rate equation modulator, which are direct modulators. All these types have an optical link multimode (MM) fiber with a photodiode in the receiver end that can be modeled. The input and output signals are analyzed using different types of modulations.

Sign in / Sign up

Export Citation Format

Share Document