Advances in high-resolution distributed sensing using a time-resolved photon counting technique

1996 ◽  
Author(s):  
Ricardo Feced ◽  
Mahmoud Farhadiroushan ◽  
Pablo Rodriguez ◽  
Vincent A. Handerek ◽  
Alan J. Rogers
Keyword(s):  
High Resolution ◽  
Photon Counting ◽  
Distributed Sensing ◽  
Time Resolved ◽  
Counting Technique

scholarly journals Fast-gated single-photon counting technique widens dynamic range and speeds up acquisition time in time-resolved measurements

2011 ◽  
Vol 19 (11) ◽  
pp. 10735 ◽  
Author(s):  
Alberto Tosi ◽  
Alberto Dalla Mora ◽  
Franco Zappa ◽  
Angelo Gulinatti ◽  
Davide Contini ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Single Photon ◽  
Photon Counting ◽  
Acquisition Time ◽  
Time Resolved ◽  
Single Photon Counting ◽  
Counting Technique ◽  
Time Resolved Measurements

Time-resolved high-resolution electron microscopy of structural stability in mgo clusters

1996 ◽  
Vol 54 ◽  
pp. 672-673
Author(s):  
T. Kizuka ◽  
N. Tanaka
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Magnesium Oxide ◽  
Structural Stability ◽  
High Resolution Electron Microscopy ◽  
Video Tape ◽  
Solid State Physics ◽  
Time Resolved ◽  
Resolution Electron ◽  
Structural And Functional Properties

Structure and stability of atomic clusters have been studied by time-resolved high-resolution electron microscopy (TRHREM). Typical examples are observations of structural fluctuation in gold (Au) clusters supported on silicon oxide films, graphtized carbon films and magnesium oxide (MgO) films. All the observations have been performed on the clusters consisted of single metal element. Structural stability of ceramics clusters, such as metal-oxide, metal-nitride and metal-carbide clusters, has not been observed by TRHREM although the clusters show anomalous structural and functional properties concerning to solid state physics and materials science.In the present study, the behavior of ceramic, magnesium oxide (MgO) clusters is for the first time observed by TRHREM at 1/60 s time resolution and at atomic resolution down to 0.2 nm.MgO and gold were subsequently deposited on sodium chloride (001) substrates. The specimens, single crystalline MgO films on which Au particles were dispersed were separated in distilled water and observed by using a 200-kV high-resolution electron microscope (JEOL, JEM2010) equipped with a high sensitive TV camera and a video tape recorder system.

Prospects of Time-Resolved Photon Emission as a Debug Tool

2002 ◽  
Author(s):  
Jim Vickers ◽  
Nader Pakdaman ◽  
Steven Kasapi
Keyword(s):  
Photon Emission ◽  
Photon Counting ◽  
Signal Propagation ◽  
General Function ◽  
Hot Electron ◽  
Detector Performance ◽  
Time Resolved ◽  
Switching Event ◽  
Emission System

Abstract Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and components that are required to scale and keep pace with the industry's requirements. It addresses the scalability of dynamic emission with the semiconductor advanced device roadmap. It is important to understand the limitations to determining that a switching event has occurred. The article explains the criteria for event detection, which is suitable for tracking signal propagation and looking for logic or other faults in which timing is not critical. It discusses conditions for event timing, whose goal is to determine accurately when a switching event has occurred, usually for speed path analysis. One of the uses of a dynamic emission system is to identify faults by studying the emission as a general function of time.

Single Point PICA Probing with an Avalanche Photo-Diode

2001 ◽  
Author(s):  
Mike Bruce ◽  
Rama R. Goruganthu ◽  
Shawn McBride ◽  
David Bethke ◽  
J.M. Chin
Keyword(s):  
Single Photon ◽  
Single Point ◽  
Photon Counting ◽  
Ring Oscillator ◽  
Time Resolved ◽  
Single Photon Counting ◽  
Photo Diode ◽  
Avalanche Photo Diode ◽  
Photo Multiplier Tube ◽  
Channel Plate

Abstract For time resolved hot carrier emission from the backside, an alternate approach is demonstrated termed single point PICA. The single point approach records time resolved emission from an individual transistor using time-correlated-single-photon counting and an avalanche photo-diode. The avalanche photo-diode has a much higher quantum efficiency than micro-channel plate photo-multiplier tube based imaging cameras typically used in earlier approaches. The basic system is described and demonstrated from the backside on a ring oscillator circuit.

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