Supercontinuum lasers for sorting and device characterization

2021 ◽  
Author(s):  
Basil Garabet
Keyword(s):  
Device Characterization

Distributed feedback device characterization using a continuous wave model

1990 ◽  
Vol 29 (21) ◽  
pp. 3110
Author(s):  
Eric T. Koenig ◽  
Mohammad A. Karim
Keyword(s):  
Continuous Wave ◽  
Wave Model ◽  
Distributed Feedback ◽  
Device Characterization

scholarly journals Junction Parameter Extraction for Electronic Device Characterization

2004 ◽  
Vol 27 (2) ◽  
pp. 61-67
Author(s):  
S. Dib ◽  
C. Salame ◽  
N. Toufik ◽  
A. Khoury ◽  
F. Pélanchon ◽  
...  
Keyword(s):  
Electronic Device ◽  
Control Process ◽  
Parameter Extraction ◽  
Exponential Model ◽  
Voltage Characteristic ◽  
Model Parameters ◽  
Current Voltage Characteristic ◽  
Device Characterization ◽  
Current Voltage

A new method for the extraction of junction parameters from a description of the current–voltage characteristic is developed. A simulation is performed and a high accuracy is obtained for the determination of the singleexponential model parameters. The method is easy to implement in a control process for device characterization. An application, achieved to observe the degradation of the emitter–base junction of a bipolar transistor during an aging experiment, shows that the evolutions of the single exponential model parameters versus time introduce a means for degradation quantification.

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