High-energy x-ray phase tomography using grating interferometer with structured anode x-ray source

System Design and Evaluation of a Compact and High Energy X-ray Talbot-Lau Grating Interferometer for Industrial Applications

Journal of the Korean Physical Society ◽

10.3938/jkps.73.1827 ◽

2018 ◽

Vol 73 (12) ◽

pp. 1827-1833 ◽

Cited By ~ 2

Author(s):

Seho Lee ◽

Ohsung Oh ◽

Youngju Kim ◽

Seung Wook Lee ◽

Insoo Kim ◽

...

Keyword(s):

System Design ◽

High Energy ◽

Industrial Applications ◽

X Ray ◽

Grating Interferometer ◽

System Design And Evaluation

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High-purity Ge x-ray detectors: Sensitivity factors and usefulness

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100136350 ◽

1990 ◽

Vol 48 (2) ◽

pp. 548-548

Author(s):

E. B. Steel

Keyword(s):

High Purity ◽

High Energy ◽

Quantitative Chemical Analysis ◽

Detector Performance ◽

X Ray ◽

Detector Sensitivity ◽

Specimen Holder ◽

Many Instruments ◽

Charge Resolution ◽

Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

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Designing high-resolution slow scan CCD-based TEM camera systems

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010012936x ◽

1992 ◽

Vol 50 (2) ◽

pp. 946-947

Author(s):

James F. Mancuso ◽

William B. Maxwell ◽

Russell E. Camp ◽

Mark H. Ellisman

Keyword(s):

Fiber Optics ◽

Ccd Camera ◽

High Energy ◽

Phosphor Layer ◽

X Ray ◽

Light Production ◽

Camera Systems ◽

X Ray Imaging ◽

Electron Image ◽

Scintillating Fiber

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.

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The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117777 ◽

1985 ◽

Vol 43 ◽

pp. 154-157

Author(s):

A.J. Tousimis

Keyword(s):

Ion Beam ◽

Depth Resolution ◽

Sample Surface ◽

High Energy ◽

X Rays ◽

X Ray ◽

Electrons And Ions ◽

Spatial Depth ◽

Minimum Surface Area ◽

Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

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Image Quality Analysis of X-ray Grating Interferometer Using Integrating-bucket Method

Journal of Imaging Science and Technology ◽

10.2352/j.imagingsci.technol.2020.64.2.020503 ◽

2020 ◽

Vol 64 (2) ◽

pp. 20503-1-20503-5

Author(s):

Faiz Wali ◽

Shenghao Wang ◽

Ji Li ◽

Jianheng Huang ◽

Yaohu Lei ◽

...

Keyword(s):

Image Quality ◽

Phase Contrast ◽

Quality Analysis ◽

Phase Contrast Imaging ◽

Phase Image ◽

Contrast Imaging ◽

High Quality ◽

Image Quality Analysis ◽

X Ray ◽

Grating Interferometer

Abstract Grating-based x-ray phase-contrast imaging has the potential to enhance image quality and provide inner structure details non-destructively. In this work, using grating-based x-ray phase-contrast imaging system and employing integrating-bucket method, the quantitative expressions of signal-to-noise ratios due to photon statistics and mechanical error are analyzed in detail. Photon statistical noise and mechanical error are the main sources affecting the image noise in x-ray grating interferometry. Integrating-bucket method is a new phase extraction method translated to x-ray grating interferometry; hence, its image quality analysis would be of great importance to get high-quality phase image. The authors’ conclusions provide an alternate method to get high-quality refraction signal using grating interferometer, and hence increases applicability of grating interferometry in preclinical and clinical usage.

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Utilisation of High-Energy Heat Sources in Magnesium Alloy Surface Layer Treatment

Archives of Metallurgy and Materials ◽

10.2478/amm-2013-0047 ◽

2013 ◽

Vol 58 (2) ◽

pp. 619-624 ◽

Cited By ~ 2

Author(s):

M. Szafarska ◽

J. Iwaszko ◽

K. Kudła ◽

I. Łegowik

Keyword(s):

Surface Layer ◽

Magnesium Alloy ◽

Physicochemical Properties ◽

Treatment Effectiveness ◽

High Energy ◽

Alloy Surface ◽

Heat Sources ◽

X Ray ◽

Additional Equipment ◽

Alloy Surface Layer

The main aim of the study was the evaluation of magnesium alloy surface treatment effectiveness using high-energy heat sources, i.e. a Yb-YAG Disk Laser and the GTAW method. The AZ91 and AM60 commercial magnesium alloys were subject to surface layer modification. Because of the physicochemical properties of the materials studied in case of the GTAW method, it was necessary to provide the welding stand with additional equipment. A novel two-torch set with torches operating in tandem was developed within the experiment. The effectiveness of specimen remelting using a laser and the GTAW method was verified based on macro- and microscopic examinations as well as in X-ray phase analysis and hardness measurements. In addition, the remelting parameters were optimised. The proposed treatment methodology enabled the achieving of the intended result and effective modification of a magnesium alloy surface layer.

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Mesoscale structural characterization within bulk materials by high-energy X-ray microdiffraction

AIAA Journal ◽

10.2514/3.14818 ◽

2001 ◽

Vol 39 ◽

pp. 919-923

Author(s):

U. Lienert ◽

H. F. Poulsen ◽

A. Kvick

Keyword(s):

Structural Characterization ◽

High Energy ◽

Bulk Materials ◽

X Ray

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Characterizations of Synthetic 8mol% YSZ with Comparison to 3mol %YSZ for HT-SOFC

Engineering and Technology Journal ◽

10.30684/etj.v38i4a.351 ◽

2020 ◽

Vol 38 (4A) ◽

pp. 491-500

Author(s):

Abeer F. Al-Attar ◽

Saad B. H. Farid ◽

Fadhil A. Hashim

Keyword(s):

Ionic Conductivity ◽

Electrochemical Impedance ◽

Structural Information ◽

Impedance Analysis ◽

High Energy ◽

Yttria Stabilized Zirconia ◽

X Ray Diffraction ◽

Stabilized Zirconia ◽

Powder Morphology ◽

X Ray

In this work, Yttria (Y2O3) was successfully doped into tetragonal 3mol% yttria stabilized Zirconia (3YSZ) by high energy-mechanical milling to synthesize 8mol% yttria stabilized Zirconia (8YSZ) used as an electrolyte for high temperature solid oxide fuel cells (HT-SOFC). This work aims to evaluate the densification and ionic conductivity of the sintered electrolytes at 1650°C. The bulk density was measured according to ASTM C373-17. The powder morphology and the microstructure of the sintered electrolytes were analyzed via Field Emission Scanning Electron Microscopy (FESEM). The chemical analysis was obtained with Energy-dispersive X-ray spectroscopy (EDS). Also, X-ray diffraction (XRD) was used to obtain structural information of the starting materials and the sintered electrolytes. The ionic conductivity was obtained through electrochemical impedance spectroscopy (EIS) in the air as a function of temperatures at a frequency range of 100(mHz)-100(kHz). It is found that the 3YSZ has a higher density than the 8YSZ. The impedance analysis showed that the ionic conductivity of the prepared 8YSZ at 800°C is0.906 (S.cm) and it was 0.214(S.cm) of the 3YSZ. Besides, 8YSZ has a lower activation energy 0.774(eV) than that of the 3YSZ 0.901(eV). Thus, the prepared 8YSZ can be nominated as an electrolyte for the HT-SOFC.

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