Actively tunable narrowband thermal emission from coupled-mode metasurfaces

2021 ◽  
Author(s):  
Arun Nagpal ◽  
Ming Zhou ◽  
Ognjen Ilic ◽  
Zongfu Yu ◽  
Harry A. Atwater
Keyword(s):  
Thermal Emission ◽  
Coupled Mode

Temporal Coupled mode theory for thermal emission from a single emitter

CLEO: 2013 ◽  
2013 ◽  
Author(s):  
Linxiao Zhu ◽  
Sunil Sandhu ◽  
Clayton Otey ◽  
Michael B. Sinclair ◽  
Ting Shan Luk ◽  
...  
Keyword(s):  
Thermal Emission ◽  
Coupled Mode Theory ◽  
Mode Theory ◽  
Coupled Mode ◽  
Single Emitter

Temporal coupled mode theory for thermal emission from a single thermal emitter supporting either a single mode or an orthogonal set of modes

2013 ◽  
Vol 102 (10) ◽  
pp. 103104 ◽  
Author(s):  
Linxiao Zhu ◽  
Sunil Sandhu ◽  
Clayton Otey ◽  
Shanhui Fan ◽  
Michael B. Sinclair ◽  
...  
Keyword(s):  
Thermal Emission ◽  
Single Mode ◽  
Coupled Mode Theory ◽  
Mode Theory ◽  
Coupled Mode ◽  
Thermal Emitter ◽  
Orthogonal Set

Measurement of lattice parameter at the nanometer scale using convergent-beam microdiffraction from a thermal emission source

1993 ◽  
Vol 51 ◽  
pp. 690-691
Author(s):  
W. T. Pike
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Thermal Emission ◽  
Lattice Parameter ◽  
Scanning Transmission Electron Microscope ◽  
Emission Source ◽  
Device Structure ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Convergent Beam

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.

Application of Backside Photo and Thermal Emission Microscopy Techniques to Advanced Memory Devices

1997 ◽  
Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel
Keyword(s):  
Thermal Emission ◽  
Test Cases ◽  
Memory Devices ◽  
Front Side ◽  
Emission Analysis ◽  
Intensity Attenuation ◽  
Analysis Techniques ◽  
Defect Sites ◽  
Emission Microscopy ◽  
Microscopy Techniques

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.

Coupled Mode Propagation in Elastic Media

2007 ◽  
Author(s):  
Ahmad T. Abawi ◽  
Michael B. Porter
Keyword(s):  
Elastic Media ◽  
Mode Propagation ◽  
Coupled Mode

APPROACHES TO MODELING THERMAL EMISSION AND REFLECTANCE IN CRISM AND OMEGA OBSERVATIONS FROM 1-5 μM

2017 ◽  
Author(s):  
Kathryn E. Powell ◽  
◽  
Raymond E. Arvidson ◽  
Linyun He ◽  
Joseph A. O'Sullivan
Keyword(s):  
Thermal Emission
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