Effective deep learning training method using blur and noise filter to detect defection in TFT-LCD PAD
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2018 ◽
Vol 43
(7)
◽
pp. 1176-1181
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2020 ◽
Vol 9
(7)
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pp. 179-189
2020 ◽
Vol 68
(7)
◽
pp. 5626-5635
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