Speckle pattern modulation for high-resolution displacement measurements

Optical Measurement Systems for Industrial Inspection XII ◽

10.1117/12.2591847 ◽

2021 ◽

Author(s):

Leon Schweickhardt ◽

Andreas Tausendfreund ◽

Dirk Stöbener ◽

Andreas Fischer

Keyword(s):

High Resolution ◽

Speckle Pattern ◽

Pattern Modulation ◽

Displacement Measurements

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High-resolution fibre-optic sensor for angular displacement measurements

Measurement Science and Technology ◽

10.1088/0957-0233/21/2/025306 ◽

2010 ◽

Vol 21 (2) ◽

pp. 025306 ◽

Cited By ~ 19

Author(s):

A Khiat ◽

F Lamarque ◽

C Prelle ◽

N Bencheikh ◽

E Dupont

Keyword(s):

High Resolution ◽

Angular Displacement ◽

Fibre Optic ◽

Fibre Optic Sensor ◽

Optic Sensor ◽

Displacement Measurements

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High resolution speckle interferometry using virtual speckle pattern produced by information of deformation process

Journal of Modern Optics ◽

10.1080/09500340802130605 ◽

2008 ◽

Vol 55 (15) ◽

pp. 2329-2345

Author(s):

Yasuhiko Arai

Keyword(s):

High Resolution ◽

Deformation Process ◽

Speckle Pattern ◽

Speckle Interferometry

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Electronic speckle pattern interferometry in long wave infrared: a new technique for combining temperature and displacement measurements: application in thermo-mechanical assessment of structures

International Conference on Space Optics — ICSO 2010 ◽

10.1117/12.2552639 ◽

2019 ◽

Author(s):

M. Georges ◽

J-F. Vandenrijt ◽

C. Thizy

Keyword(s):

Speckle Pattern ◽

New Technique ◽

Electronic Speckle Pattern Interferometry ◽

Long Wave ◽

A New Technique ◽

Long Wave Infrared ◽

Displacement Measurements

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High resolution lateral force-displacement measurements as a tool for the determination of lateral contact stiffness and Poisson's ratio

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2017.09.065 ◽

2017 ◽

Vol 330 ◽

pp. 17-25

Author(s):

T. Chudoba

Keyword(s):

High Resolution ◽

Poisson’S Ratio ◽

Contact Stiffness ◽

Lateral Force ◽

Poisson's Ratio ◽

Lateral Contact ◽

Force Displacement ◽

Displacement Measurements

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Phase-shifting digital speckle pattern interferometry: off-the-shelf setup description and application to stainless steel membrane displacement measurements

10.1117/12.516580 ◽

2003 ◽

Cited By ~ 1

Author(s):

Pierre R. Slangen ◽

B. Gautier

Keyword(s):

Stainless Steel ◽

Speckle Pattern ◽

Phase Shifting ◽

Digital Speckle Pattern Interferometry ◽

Digital Speckle ◽

Displacement Measurements ◽

Membrane Displacement

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Application of a focused laser beam in a grating interferometer for high-resolution displacement measurements

Optical Engineering ◽

10.1117/1.602136 ◽

1999 ◽

Vol 38 (6) ◽

pp. 958 ◽

Cited By ~ 5

Author(s):

Marek Dobosz

Keyword(s):

High Resolution ◽

Laser Beam ◽

Grating Interferometer ◽

Displacement Measurements

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Concepts of direct in-plane strain and variable sensitivity in-plane displacement measurements using high-resolution moire´ photography

Optical Engineering ◽

10.1117/1.601620 ◽

1998 ◽

Vol 37 (1) ◽

pp. 331

Author(s):

Pramod K. Rastogi

Keyword(s):

High Resolution ◽

Plane Strain ◽

Variable Sensitivity ◽

Plane Displacement ◽

Displacement Measurements

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Noise reduction in high-resolution speckle displacement measurements through ensemble averaging

Applied Optics ◽

10.1364/ao.416028 ◽

2021 ◽

Vol 60 (7) ◽

pp. 1871

Author(s):

León Schweickhardt ◽

Andreas Tausendfreund ◽

Dirk Stöbener ◽

Andreas Fischer

Keyword(s):

High Resolution ◽

Noise Reduction ◽

Ensemble Averaging ◽

Displacement Measurements

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High-resolution electric speckle pattern interferometry by using only two speckle patterns

10.1117/12.892967 ◽

2011 ◽

Author(s):

Y. Arai ◽

T. Inoue ◽

S. Yokozeki

Keyword(s):

High Resolution ◽

Speckle Pattern ◽

Speckle Patterns

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Speckle Pattern Characterisation for High Resolution Digital Image Correlation

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.70.261 ◽

2011 ◽

Vol 70 ◽

pp. 261-266 ◽

Cited By ~ 2

Author(s):

G. Crammond ◽

S.W. Boyd ◽

Janice M. Dulieu-Barton

Keyword(s):

High Resolution ◽

Digital Image Correlation ◽

Spatial Resolution ◽

Digital Image ◽

Speckle Pattern ◽

Correlation Method ◽

Image Correlation ◽

Optical Technique ◽

Full Field ◽

Grey Scale

Digital image correlation (DIC) is an optical technique for full field deformation measurement. The spatial resolution and precision of the measurements are limited by the number of pixels within the image. The use of magnifying optics provides greater spatial resolution images, enabling smaller displacements to be observed with greater accuracy. Increasing the magnification of an image significantly changes the appearance of the non-periodic, stochastic speckle pattern which provides the grey scale contrast necessary for the image correlation method. In the paper a methodology is developed to evaluate the properties of different speckle pattern types under a range of resolutions up to 705 pixel / mm. Numerical deformation of the patterns is also undertaken to evaluate how the changes in the pattern properties affect the accuracy of the DIC measurements.

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