A new method to calibrate an atomic force microscope with the self-traceable chromium grating fabricated by atomic lithography

2020 ◽  
Author(s):  
Zhenjie Gu ◽  
Xiao Deng ◽  
Yanni Cai ◽  
Xinpan Wang ◽  
Feng Yang
Keyword(s):  
Atomic Force Microscope ◽  
The Self ◽  
New Method ◽  
Atomic Force ◽  
Atomic Lithography

The Nano Membrane-Like Structure of the Precambrian Microfossils under Atomic Force Microscope (AFM)

2007 ◽  
Vol 121-123 ◽  
pp. 739-742 ◽  
Author(s):  
H.M. Chi ◽  
Z.D. Xiao ◽  
Xin Xing Xiao
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Early Life ◽  
Three Dimensional ◽  
New Method ◽  
Subcellular Structure ◽  
Atomic Force ◽  
Fossil Embryos ◽  
Scanning Electron

Weng`an fauna in Guizhou, China provides a unique window for the evolution of the early life especially since the animal embryos and sponge is found there. Phosphatization makes the fossils preserve in details including cells and subcellular structure. Here we use atomic force microscope observing the surface of some three dimensional preserved embryo fossils and the ultra membrane-like structure is found under atomic force microscope (AFM) while such structure can`t be found under scanning electron microscope (SEM). The membrane-like structure is approximately 10nm in thickness which maybe one part of the fossil embryos or belong to another nano scale microfossils. Therefore, AFM provides a new method for the study of the ultra structure of the microfossils from Weng`an fauna.

Influence of Tunable External Stimuli on the Self-Assembly of Guanosine Supramolecular Nanostructures Studied By Atomic Force Microscope

Langmuir ◽  
2009 ◽  
Vol 25 (23) ◽  
pp. 13432-13437 ◽  
Author(s):  
Yinli Li ◽  
Mingdong Dong ◽  
Daniel E Otzen ◽  
Yuheng Yao ◽  
Bo Liu ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Self Assembly ◽  
The Self ◽  
Atomic Force ◽  
External Stimuli

Recent Progress in Self-sensing Probe Technology in Atomic Force Microscope

2021 ◽  
Vol 17 ◽  
Author(s):  
Ke Xu ◽  
Chenghao Ji ◽  
Fanan Wei ◽  
Zhushan Zhai
Keyword(s):  
Atomic Force Microscope ◽  
The Self ◽  
The Novel ◽  
Reflection Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sample Characterization ◽  
Cantilever Array ◽  
New Applications ◽  
Imaging Performance

: The imaging speed of atomic force microscope (AFM) is limited by the cantilever mechanical bandwidth, which can be increased by reducing the size of the cantilever. However, the ordinary laser reflection method cannot measure the deflection of a small cantilever. And some samples are sensitive to light detection and not suitable for the laser reflection method. Therefore, the self-induction probe technology was developed to solve this problem. This article reviews the latest AFM self-induction probe technology and introduces three types of self-induction probes. Firstly, it is introduced that the current self-sensing probes can be divided into piezoresistive type, piezoelectric type and tuning fork type according to the working mechanisms and preparation materials. Then, the latest materials and structures of various self-sensing probe technologies are introduced to improve imaging performance and their applications in various fields. And, compared with traditional laser reflection methods, the self-sensing probe technologies have a simpler structure, take up less space and can be integrated in a large cantilever array and adopted for imaging of photosensitive products. Finally, some prospects of the novel imaging and sample characterization techniques and new applications of atomic force microscopy are also discussed.

A New Sublimation Etching for Reproducible Growth of Epitaxial Layers of SiC on SiC Substrate in a CVD Reactor

2000 ◽  
Vol 640 ◽  
Author(s):  
Rongjun Wang ◽  
Ishwara Bhat ◽  
Paul Chow
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Epitaxial Growth ◽  
Etch Rate ◽  
Fast Rate ◽  
New Method ◽  
Simple Method ◽  
Atomic Force ◽  
Etching Method ◽  
Very High

ABSTRACTWe have developed a new and simple method to etch SiC at relatively low temperature with very high rates. This method is particularly useful for cleaning the susceptor after growth. By employing this etching method to clean the susceptor prior to every growth run, we have greatly improved the reproducibility of SiC epitaxial growth and increased the lifetime of the susceptor. The method can also be used to etch SiC wafers at a very fast rate as an alternative to mechanical polishing. An etch rate of over 100μm/hr was obtained at 1600°C using this new method. The surfaces of the etched wafers were examined by atomic force microscope (AFM). Results of epitaxial growth using new etching method are presented.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

The application of atomic force microscope in microbiological research

2014 ◽  
Vol 5 (1) ◽  
pp. 27-30
Author(s):  
Małgorzata Tokarska-Rodak ◽  
Maria Kozioł-Montewka ◽  
Jolanta Paluch-Oleś ◽  
Dorota Plewik ◽  
Grażyna Olchowik ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Microbiological Research
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