Integrated simultaneous chemical, surface potential, mechanical, and topographic Imaging at < 10 nm spatial resolution

2021 ◽  
Author(s):  
Devon S. Jakob ◽  
Xiaoji G. Xu
Keyword(s):  
Spatial Resolution ◽  
Surface Potential ◽  
Chemical Surface ◽  
Topographic Imaging

High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Noncontact Atomic Force Microscopy

2008 ◽  
Vol 47 (7) ◽  
pp. 6085-6087 ◽  
Author(s):  
Daisuke Sawada ◽  
Takashi Namikawa ◽  
Masuhiro Hiragaki ◽  
Yoshiaki Sugimoto ◽  
Masayuki Abe ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Force Microscopy ◽  
Distance Analysis ◽  
Atomic Force ◽  
Topographic Imaging

High spatial resolution surface potential measurements using secondary electrons

1980 ◽  
Vol 93 (2-3) ◽  
pp. A100-A101
Author(s):  
A.P. Janssen ◽  
P. Akhter ◽  
C.J. Harland ◽  
J.A. Venables
Keyword(s):  
Spatial Resolution ◽  
Surface Potential ◽  
High Spatial Resolution ◽  
Secondary Electrons ◽  
Surface Potential Measurements

Kelvin Probe Force Microscope Measurement Uncertainty

2011 ◽  
Vol 222 ◽  
pp. 114-117
Author(s):  
Maciej Ligowski ◽  
Michiharu Tabe ◽  
Ryszard Jabłoński
Keyword(s):  
Measurement Uncertainty ◽  
Spatial Resolution ◽  
Surface Potential ◽  
High Spatial Resolution ◽  
High Sensitivity ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Calibration Methods ◽  
Standard Calibration ◽  
Nanoscale Measurements

Kelvin Probe Force Microscopy is an attractive technique for characterizing the surface potential of various samples. The main advantage of this technique is its high spatial resolution together with high sensitivity. However as in any nanoscale measurements also in case of KFM it is extremly difficult to describe the uncertainty of the measurement. Moreover, a wide variety of measuring conditions, together with the complicated operation principle cause situation, where no standard calibration methods are available. In the paper we propose the model of the KFM microscope and analyze the uncertainty of the KFM measurement.

High spatial resolution surface potential measurements using secondary electrons

1980 ◽  
Vol 93 (2-3) ◽  
pp. 453-470 ◽  
Author(s):  
A.P. Janssen ◽  
P. Akhter ◽  
C.J. Harland ◽  
J.A. Venables
Keyword(s):  
Spatial Resolution ◽  
Surface Potential ◽  
High Spatial Resolution ◽  
Secondary Electrons ◽  
Surface Potential Measurements

Effect of fiber arrangement on spatial resolution of near-infrared topographic imaging

2003 ◽  
Author(s):  
Nobuhiro Okui ◽  
Takuma Kadoya ◽  
Tsuyoshi Yamamoto ◽  
Eiji Okada
Keyword(s):  
Spatial Resolution ◽  
Near Infrared ◽  
Fiber Arrangement ◽  
Topographic Imaging
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