Development of dual-side view swept source optical coherence tomography for opaque materials thickness measurement

Author(s):  
Wu Qian ◽  
Xiwen Wang ◽  
Jiewen Chen ◽  
Mo Jianhua
Author(s):  
Rosa Dolz-Marco ◽  
María Andreu-Fenoll ◽  
Pablo Hernández-Martínez ◽  
M. Dolores Pinazo-Durán ◽  
Roberto Gallego-Pinazo

2020 ◽  
Vol 45 (4) ◽  
pp. 832
Author(s):  
Qian Wu ◽  
Xiwen Wang ◽  
Linbo Liu ◽  
Jianhua Mo

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