Investigation on characteristics of multi-beam interference pattern for 3D structured-illumination incoherent holographic imaging

2020 ◽  
Author(s):  
Yutong Yan ◽  
Yuhong Wan ◽  
Hanbin Yu ◽  
Chao Liu ◽  
Yi Qin
Keyword(s):  
Interference Pattern ◽  
Structured Illumination ◽  
Holographic Imaging

Addressing Wavenumber Error in Interference Pattern Structured Illumination Imaging

2020 ◽  
Author(s):  
Benjamin Whetten ◽  
Carter F. Day ◽  
Dallin S. Durfee ◽  
Richard L. Sandberg
Keyword(s):  
Interference Pattern ◽  
Structured Illumination

Gated holographic imaging for structured illumination through obscurations

2017 ◽  
Vol 42 (13) ◽  
pp. 2543 ◽  
Author(s):  
P. S. Lebow ◽  
A. T. Watnik ◽  
J. R. Lindle
Keyword(s):  
Structured Illumination ◽  
Holographic Imaging

scholarly journals Mechanically scanned interference pattern structured illumination imaging

2019 ◽  
Vol 27 (10) ◽  
pp. 14969
Author(s):  
Jarom Jackson ◽  
Dallin Durfee
Keyword(s):  
Interference Pattern ◽  
Structured Illumination

scholarly journals Understanding and Correcting Wavenumber Error in Interference Pattern Structured Illumination Imaging

2021 ◽  
Author(s):  
Ben Whetten ◽  
Jarom Jackson ◽  
Richard Sandberg ◽  
Dallin Durfee
Keyword(s):  
Interference Pattern ◽  
Structured Illumination

Computer analysis of side-band holography in STEM

1991 ◽  
Vol 49 ◽  
pp. 684-685
Author(s):  
M.A. Gribelyuk ◽  
J.M. Cowley
Keyword(s):  
Interference Pattern ◽  
Computer Analysis ◽  
Side Band ◽  
Diffraction Plane ◽  
Illumination System ◽  
Probe Size

Recently the use of a biprism in a STEM instrument has been suggested for recording of a hologram. A biprism is inserted in the illumination system and creates two coherent focussed beams at the specimen level with a probe size d= 5-10Å. If one beam passes through an object and another one passes in vacuum, an interference pattern, i.e. a hologram can be observed in diffraction plane (Fig.1).

Performance and applications of the holography electron microscope

1993 ◽  
Vol 51 ◽  
pp. 1078-1079
Author(s):  
Akira Tonomura
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Phase Measurement ◽  
Electron Holography ◽  
Imaging Method ◽  
High Contrast ◽  
Magnetic Lens ◽  
High Brightness ◽  
Holographic Imaging ◽  
Dynamic Observation

Electron holography is a two-step imaging method. However, the ultimate performance of holographic imaging is mainly determined by the brightness of the electron beam used in the hologram-formation process. In our 350kV holography electron microscope (see Fig. 1), the decrease in the inherently high brightness of field-emitted electrons is minimized by superposing a magnetic lens in the gun, for a resulting value of 2 × 109 A/cm2 sr. This high brightness has lead to the following distinguished features. The minimum spacing (d) of carrier fringes is d = 0.09 Å, thus allowing a reconstructed image with a resolution, at least in principle, as high as 3d=0.3 Å. The precision in phase measurement can be as high as 2π/100, since the position of fringes can be known precisely from a high-contrast hologram formed under highly collimated illumination. Dynamic observation becomes possible because the current density is high.

MULTIPLE SCATTERING SUPPRESSION IN PLANAR LASER IMAGING OF DENSE SPRAYS BY MEANS OF STRUCTURED ILLUMINATION

2010 ◽  
Vol 20 (2) ◽  
pp. 133-139 ◽  
Author(s):  
Edouard Berrocal ◽  
Elias Kristensson ◽  
Mattias Richter ◽  
Mark Linne ◽  
Marcus Alden
Keyword(s):  
Multiple Scattering ◽  
Structured Illumination ◽  
Laser Imaging ◽  
Planar Laser
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