Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)
2019 ◽
Vol 21
(20)
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pp. 10391-10401
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Keyword(s):
Keyword(s):
2001 ◽
Vol 357-360
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pp. 146-148
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Keyword(s):
1998 ◽
Vol 76-77
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pp. 416-419
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