High precision free-form optics and application to soft x-ray mirrors

2020 ◽  
Author(s):  
Takehiro Kume ◽  
Kentarou Hiraguri ◽  
Yoichi Imamura ◽  
Hiroaki Miyashita ◽  
T. Mukoda ◽  
...  
Keyword(s):  
High Precision ◽  
Free Form ◽  
X Ray

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

High‐precision x‐ray reflectivity study of ultrathin SiO2 on Si

1996 ◽  
Vol 14 (3) ◽  
pp. 971-976 ◽  
Author(s):  
N. Awaji ◽  
Y. Sugita ◽  
T. Nakanishi ◽  
S. Ohkubo ◽  
K. Takasaki ◽  
...  
Keyword(s):  
High Precision ◽  
X Ray

scholarly journals Changing mass liner system for generation of soft X rays

1997 ◽  
Vol 15 (1) ◽  
pp. 133-138 ◽  
Author(s):  
A.M. Buyko ◽  
O.M. Burenkov ◽  
V.K. Chernyshev ◽  
S.F. Garanin ◽  
S.D. Kuznetsov ◽  
...  
Keyword(s):  
Current Pulse ◽  
High Precision ◽  
X Rays ◽  
Stored Energy ◽  
Single Experiment ◽  
X Ray ◽  
Liner System ◽  
The Cost

Powerful pulse installations are usually used to produce large yields of X-ray radiation. With an increase of the stored energy up to 100 MJ, the costof a single experiment on these installations becomes comparable to the cost of a shot with explosive magnetic generators (EMG), according to expert estimates. The physical scheme of a device with a changeable mass liner forlarge soft X-ray (in the range of 0.3 to 0.5 keV) yields eneration is investigated. The scheme investigated is substantially free from difficulties connected with high precision liners and fast switches for current pulse sharpening.

Investigation on the Preparation of High Precision Multilayer X-ray Fresnel Zone Plates Based on Atomic Layer Deposition Technology

2021 ◽  
Vol 50 (1) ◽  
pp. 156-164
Author(s):  
吴鹿杰 Lujie WU ◽  
文庆涛 Qingtao WEN ◽  
高雅增 Yazeng GAO ◽  
卢维尔 Weier LU ◽  
夏洋 Yang XIA ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
High Precision ◽  
Fresnel Zone ◽  
Atomic Layer ◽  
Fresnel Zone Plates ◽  
X Ray ◽  
Zone Plates ◽  
Layer Deposition ◽  
Deposition Technology

High-Precision Characterization of Super-Multiperiod AlGaAs/GaAs Superlattices Using X-Ray Reflectometry on a Synchrotron Source

2021 ◽  
Author(s):  
L. I. Goray ◽  
E. V. Pirogov ◽  
M. V. Svechnikov ◽  
M. S. Sobolev ◽  
N. K. Polyakov ◽  
...  
Keyword(s):  
High Precision ◽  
Synchrotron Source ◽  
X Ray

Ion track etching of polycarbonate membranes monitored by in situ small angle X-ray scattering

2021 ◽  
Author(s):  
Alexander Kiy ◽  
Christian Notthoff ◽  
Shankar Dutt ◽  
Mark Grigg ◽  
Andrea Hadley ◽  
...  
Keyword(s):  
High Precision ◽  
Small Angle ◽  
Selective Dissolution ◽  
X Ray ◽  
Ion Tracks ◽  
X Ray Scattering ◽  
Track Etching ◽  
Polycarbonate Membranes ◽  
Ray Scattering

In situ small angle X-ray scattering (SAXS) measurements of ion track etching of polycarbonate foils are used to directly monitor the selective dissolution of ion tracks with high precision, including...

Fully Automated High-Precision X-Ray Diffraction

1968 ◽  
pp. 359-375 ◽  
Author(s):  
T. W. Baker ◽  
J. D. George ◽  
B. A. Bellamy ◽  
R. Causer
Keyword(s):  
High Precision ◽  
X Ray Diffraction ◽  
X Ray

Structural study of the X-ray-induced enzymatic reaction of octahaem cytochromecnitrite reductase

2015 ◽  
Vol 71 (5) ◽  
pp. 1087-1094 ◽  
Author(s):  
A. A. Trofimov ◽  
K. M. Polyakov ◽  
V. A. Lazarenko ◽  
A. N. Popov ◽  
T. V. Tikhonova ◽  
...  
Keyword(s):  
Nitrite Reductase ◽  
Catalytic Reaction ◽  
Active Sites ◽  
Enzymatic Reaction ◽  
Absorbed Dose ◽  
Free Form ◽  
Data Sets ◽  
X Rays ◽  
X Ray ◽  
Site Water

Octahaem cytochromecnitrite reductase from the bacteriumThioalkalivibrio nitratireducenscatalyzes the reduction of nitrite to ammonium and of sulfite to sulfide. The reducing properties of X-ray radiation and the high quality of the enzyme crystals allow study of the catalytic reaction of cytochromecnitrite reductase directly in a crystal of the enzyme, with the reaction being induced by X-rays. Series of diffraction data sets with increasing absorbed dose were collected from crystals of the free form of the enzyme and its complexes with nitrite and sulfite. The corresponding structures revealed gradual changes associated with the reduction of the catalytic haems by X-rays. In the case of the nitrite complex the conversion of the nitrite ions bound in the active sites to NO species was observed, which is the beginning of the catalytic reaction. For the free form, an increase in the distance between the oxygen ligand bound to the catalytic haem and the iron ion of the haem took place. In the case of the sulfite complex no enzymatic reaction was detected, but there were changes in the arrangement of the active-site water molecules that were presumably associated with a change in the protonation state of the sulfite ions.

High precision alignment of x‐ray transmission diffraction gratings

1988 ◽  
Vol 59 (3) ◽  
pp. 420-422 ◽  
Author(s):  
Andrew M. Hawryluk ◽  
Sherry L. Hill
Keyword(s):  
High Precision ◽  
Diffraction Gratings ◽  
X Ray
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