Quantum limited digital holography and the limits of spatial heterodyne detection (Conference Presentation)

2020 ◽  
Author(s):  
Thomas G. Brown
Keyword(s):  
Digital Holography ◽  
Heterodyne Detection

USE OF A CO2LASER AS A LOCAL OSCILLATOR FOR A 10 MICRON HETERODYNE DETECTION

1987 ◽  
Vol 48 (C7) ◽  
pp. C7-569-C7-571
Author(s):  
A. DELAHAIGUE ◽  
D. COURTOIS ◽  
C. THIEBEAUX ◽  
H. LE CORRE
Keyword(s):  
Local Oscillator ◽  
Heterodyne Detection

Generalized Heterodyne Configurations for Photo-induced Force Microscopy

2019 ◽  
Author(s):  
Le Wang ◽  
Devon Jakob ◽  
Haomin Wang ◽  
Alexis Apostolos ◽  
Marcos M. Pires ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Repetition Rate ◽  
Modulation Frequency ◽  
High Harmonic ◽  
Chemical Imaging ◽  
Heterodyne Detection ◽  
Force Microscopy ◽  
Wide Range ◽  
The Difference ◽  
Afm Cantilever

<div>Infrared chemical microscopy through mechanical probing of light-matter interactions by atomic force microscopy (AFM) bypasses the diffraction limit. One increasingly popular technique is photo-induced force microscopy (PiFM), which utilizes the mechanical heterodyne signal detection between cantilever mechanical resonant oscillations and the photo induced force from light-matter interaction. So far, photo induced force microscopy has been operated in only one heterodyne configuration. In this article, we generalize heterodyne configurations of photoinduced force microscopy by introducing two new schemes: harmonic heterodyne detection and sequential heterodyne detection. In harmonic heterodyne detection, the laser repetition rate matches integer fractions of the difference between the two mechanical resonant modes of the AFM cantilever. The high harmonic of the beating from the photothermal expansion mixes with the AFM cantilever oscillation to provide PiFM signal. In sequential heterodyne detection, the combination of the repetition rate of laser pulses and polarization modulation frequency matches the difference between two AFM mechanical modes, leading to detectable PiFM signals. These two generalized heterodyne configurations for photo induced force microscopy deliver new avenues for chemical imaging and broadband spectroscopy at ~10 nm spatial resolution. They are suitable for a wide range of heterogeneous materials across various disciplines: from structured polymer film, polaritonic boron nitride materials, to isolated bacterial peptidoglycan cell walls. The generalized heterodyne configurations introduce flexibility for the implementation of PiFM and related tapping mode AFM-IR, and provide possibilities for additional modulation channel in PiFM for targeted signal extraction with nanoscale spatial resolution.</div>

Digital holography with a set of two close wavelengths for height measurement of solder bumps

2020 ◽  
Vol 59 (SO) ◽  
pp. SOOE03
Author(s):  
Hiroyuki Ishigaki ◽  
Takahiro Mamiya ◽  
Yoshio Hayasaki
Keyword(s):  
Digital Holography ◽  
Height Measurement ◽  
Solder Bumps

Development of 72K Ultra-High-Resolution SLMoG system for high-capacity digital holography image

2019 ◽  
pp. 952
Author(s):  
Jae-Eun Pi ◽  
Ji-Hun Choi ◽  
Jong-Heon Yang ◽  
Chi-Young Hwang ◽  
Gi Heon Kim ◽  
...  
Keyword(s):  
High Resolution ◽  
Digital Holography ◽  
High Capacity

scholarly journals Combined Reduced Phase Dual-Directional Illumination Digital Holography and Speckle Displacements for Shape Measurement

2019 ◽  
Vol 2019 ◽  
pp. 1-6
Author(s):  
Davood Khodadad
Keyword(s):  
Phase Difference ◽  
Digital Holography ◽  
Relative Phase ◽  
Groove Depth ◽  
Phase Unwrapping ◽  
Shape Measurement ◽  
Phase Ambiguity ◽  
Holographic Method ◽  
Height Range ◽  
Phase Differences

We present a digital holographic method to increase height range measurement with a reduced phase ambiguity using a dual-directional illumination. Small changes in the angle of incident illumination introduce phase differences between the recorded complex fields. We decrease relative phase difference between the recorded complex fields 279 and 139 times by changing the angle of incident 0.5° and 1°, respectively. A two cent Euro coin edge groove is used to measure the shape. The groove depth is measured as ≈300  μm. Further, numerical refocusing and analysis of speckle displacements in two different planes are used to measure the depth without a use of phase unwrapping process.

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