Scalable tiled silicon-photonic 2D wavelength-steered optical beam LIDAR apertures (Conference Presentation)

2020 ◽  
Author(s):  
Miloš A. Popovic ◽  
Nathan Dostart ◽  
Bohan Zhang ◽  
Anatol N. Khilo ◽  
Michael Brand ◽  
...  
Keyword(s):  
Optical Beam ◽  
Silicon Photonic

scholarly journals Sub-wavelength-pitch silicon-photonic optical phased array for large field-of-regard coherent optical beam steering

2019 ◽  
Vol 27 (3) ◽  
pp. 1929 ◽  
Author(s):  
Yu Zhang ◽  
Yi-Chun Ling ◽  
Kaiqi Zhang ◽  
Cale Gentry ◽  
David Sadighi ◽  
...  
Keyword(s):  
Phased Array ◽  
Beam Steering ◽  
Optical Beam ◽  
Large Field ◽  
Silicon Photonic ◽  
Optical Phased Array ◽  
Sub Wavelength

Electromagnetically Driven 2-axis Optical Beam Steering MEMS Mirror and Its Dependence of Actuation on Magnetic Field

2010 ◽  
Vol 130 (4) ◽  
pp. 107-112 ◽  
Author(s):  
Yoshiyuki Watanabe ◽  
Yutaka Abe ◽  
Shinnosuke Iwamatsu ◽  
Seiya Kobayashi ◽  
Yoshiyuki Takahashi ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Beam Steering ◽  
Optical Beam

Ultra-Small Silicon Photonic Wire Waveguide Devices

2009 ◽  
Vol E92-C (2) ◽  
pp. 217-223 ◽  
Author(s):  
Tao CHU ◽  
Hirohito YAMADA ◽  
Shigeru NAKAMURA ◽  
Masashige ISHIZAKA ◽  
Masatoshi TOKUSHIMA ◽  
...  
Keyword(s):  
Waveguide Devices ◽  
Silicon Photonic ◽  
Photonic Wire

Slow-light Enhanced Nonlinear Optics in Silicon Photonic Crystal Waveguides

PIERS Online ◽  
2010 ◽  
Vol 6 (3) ◽  
pp. 273-278 ◽  
Author(s):  
David J. Moss ◽  
B. Corcoran ◽  
C. Monat ◽  
Christian Grillet ◽  
T. P. White ◽  
...  
Keyword(s):  
Photonic Crystal ◽  
Nonlinear Optics ◽  
Slow Light ◽  
Photonic Crystal Waveguides ◽  
Silicon Photonic

Comparison of Active and Passive Voltage Contrast for Failure Localization

2007 ◽  
Author(s):  
R. Rosenkranz ◽  
W. Werner
Keyword(s):  
Case Studies ◽  
Optical Beam ◽  
Leakage Currents ◽  
Localization Method ◽  
Voltage Contrast ◽  
Failure Localization

Abstract In many cases of failure localization, passive voltage contrast (PVC) localization method does not work, because it is not possible to charge up conducting structures which supposed to be dark in the SEM and FIB images. The reason for this is leakage currents. In this article, the authors show how they succeeded in overcoming these difficulties by the application of the active voltage contrast (AVC) method as it was described as biased voltage contrast by Campbell and Soden. They identified three main cases where the PVC didn't work but where they succeeded in failure localization with the AVC method. This is illustrated with the use of two case studies. Compared to the optical beam based methods the resolution is much better so a single failing contact of e.g. 70 nm technology can clearly be identified which cannot be done by TIVA or OBIRCH.

Concept, design and verification of components for an integrated on-detector silicon photonic multichannel transmitter

2019 ◽  
Author(s):  
Yunlong Zhang ◽  
Djorn Karnick ◽  
Marc Schneider ◽  
Lars Eisenblätter ◽  
Thomas Kühner ◽  
...  
Keyword(s):  
Concept Design ◽  
Silicon Photonic
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