Tabletop high-resolution breast specimen imaging system based on field emission CNT x-ray source

2020 ◽  
Author(s):  
Amar Prasad Gupta ◽  
Jaekyu Jang ◽  
Seung Jun Yeo ◽  
Jaeik Jung ◽  
Jinho Choi ◽  
...  
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Imaging System ◽  
X Ray

Developments of X-Ray Grating Imaging Technology

2014 ◽  
Vol 898 ◽  
pp. 614-617
Author(s):  
Rui Hong Li ◽  
Yue Ping Han
Keyword(s):  
High Resolution ◽  
Imaging System ◽  
Imaging Techniques ◽  
Field Of View ◽  
Imaging Systems ◽  
Large Field ◽  
X Ray ◽  
X Ray Imaging ◽  
Angle Scattering ◽  
Interferometry Method

The present paper reviews the X-ray grating imaging systems at home and abroad from the aspects of technological characterizations and the newest researching focus. First, not only the imaging principles and the frameworks of the typical X-ray grating imaging system based on Talbot-Lau interferometry method, but also the algorithms of retrieving the signals of attenuation, refraction and small-angle scattering are introduced. Second, the system optimizing methods are discussed, which involves mainly the relaxing the requirement of high positioning resolution and strict circumstances for gratings and designing large field of view with high resolution. Third, two and four-dimensional grating-based X-ray imaging techniques are introduced.

The Effect of Ti Addition on the Properties of Al-B4C Interface: A Microstructural Study

2010 ◽  
Vol 636-637 ◽  
pp. 192-197 ◽  
Author(s):  
F. Toptan ◽  
Ayfer Kilicarslan ◽  
Isil Kerti
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Reaction Layer ◽  
Liquid Aluminium ◽  
Microstructural Study ◽  
X Ray ◽  
Eds Analysis ◽  
Matrix Reinforcement ◽  
Ti Addition ◽  
Aluminium Metal

In the present work, Al-B4C composites were produced by casting route at 850°C and titanium-containing flux was used to overcome the wetting problem between B4C and liquid aluminium metal. The microstructure of matrix/reinforcement interface was investigated using SEM studies with or without Ti added composites. The reaction layer was also characterized with EDS analysis and X-ray mapping. It was found from the microstructural observations by high resolution field emission gun SEM (FEG-SEM) that the wetting issue was effectively solved by the formation of very thin (80-180 nm in thickness) Ti-C and Ti-B reaction layers.

High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube

1998 ◽  
Vol 5 (3) ◽  
pp. 1079-1081
Author(s):  
Shigeru Kimura ◽  
Tatsuya Matsumura ◽  
Katsuyuki Kinoshita ◽  
Keiichi Hirano ◽  
Hiroshi Kihara
Keyword(s):  
High Resolution ◽  
Digital Imaging ◽  
Imaging System ◽  
Silicon Crystal ◽  
Stage Structure ◽  
Magnification Factor ◽  
Double Crystal ◽  
X Ray ◽  
Imaging Detector ◽  
High Resolution Images

A Be-window-type X-ray zooming tube is an X-ray digital imaging system whose magnification factor of X-ray images can be easily varied from 10 to 200, and whose spatial resolution is less than 0.5 µm. This zooming tube was used as an imaging detector in double-crystal X-ray topography to obtain high-resolution images of dislocations in a silicon crystal. X-ray interference images of about 5 µm were observed even though optimal performance of the X-ray zooming tube could not be achieved. The results indicate that the X-ray zooming tube might make a good detector for X-ray topography with minor improvements in its stage structure.

Development of a high-resolution x-ray imaging system with a charge-coupled-device detector coupled with crystal x-ray magnifiers

2000 ◽  
Vol 71 (12) ◽  
pp. 4449 ◽  
Author(s):  
K. Sato ◽  
Y. Hasegawa ◽  
K. Kondo ◽  
K. Miyazaki ◽  
T. Matsushita ◽  
...  
Keyword(s):  
High Resolution ◽  
Imaging System ◽  
Charge Coupled Device ◽  
X Ray ◽  
X Ray Imaging ◽  
A Charge

High-resolution biological microanalysis in the field-emission STEM

1990 ◽  
Vol 48 (2) ◽  
pp. 154-155
Author(s):  
R.D. Leapman ◽  
S.B. Andrews
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Low Dose ◽  
Dark Field ◽  
X Ray ◽  
Macromolecular Assemblies ◽  
Freeze Dried ◽  
Annular Dark Field ◽  
20 Nm ◽  
Electron Energy Loss

The recent availability of a cryotransfer stage, efficient electron energy loss spectrometers (EELS), and ultrathin window energy-dispersive x-ray spectrometers (EDXS) for the VG Microscopes HB501 field-emission STEM now provides this instrument with the potential for high resolution (<20 nm) biological microanalysis. In practice, limits are normally imposed by the sample itself, due to damage in the electron beam and to changes in structure and composition during freezing, sectioning, transfering and freeze-drying. We have therefore investigated what types of useful high-resolution analytical information can be obtained from rapidly frozen samples, including thin tissue cryosections and frozen isolated macromolecules and macromolecular assemblies.Frozen-hydrated samples were cryotransfered at ~-175C into the VG STEM after which a vacuum of ~3x10-9 mbar was maintained. Samples were freeze-dried by warming to ~-90C over 30 min and were then recooled to below ~-160C to minimize radiation damage and contamination during analysis. Digital annular dark-field images were obtained at low dose (~10 e/Å2) with single electron sensitivity, using a probe current of 2 to10 pA and a beam energy of 100 keV.

Stem Dark-Field Image Using A 200-kV AEM

1996 ◽  
Vol 54 ◽  
pp. 444-445
Author(s):  
T. Tomita ◽  
T. Honda ◽  
M. Kersker
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Thermal Field ◽  
Imaging System ◽  
Dark Field Image ◽  
Dark Field ◽  
Specimen Thickness ◽  
High Angle ◽  
Long Term Stability ◽  
Annular Dark Field

Interpretation of the high resolution transmission image typically requires simulation since the contrast changes in a complicated way due to changes in focus and specimen thickness. The contrast in images formed by collecting high angle forward scattered electrons in STEM does not change with changes in thickness or defocus.Until recently, high angle annular dark field (HADF) images were obtained only from instruments using cold field emission guns. Recently we have attempted to obtain HADF images using Schottky (ZrO/W(100)) thermal field emission and using a 200kV instrument designed as a comprehensive TEM/STEM. Advantages of the ZrO/W emitter are easy operation, very good short and long term stability, high brightness, and narrow energy spread. This microscope, The JEM2010F with thermal field emission, allows subnanometer analysis with EDS(spot, line, and mapping), EELS, holograms, etc, and has a standard TEM imaging system for high resolution imaging and for various diffraction modes, viz., CBED, selected area, Tanaka, etc.

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