The impact of ultraviolet light on the switching characteristics of NiO resistive random-access memory (ReRAM) devices
2018 ◽
Vol 51
(22)
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pp. 225102
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2016 ◽
Vol 16
(10)
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pp. 10303-10307
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2011 ◽
Vol 50
(4S)
◽
pp. 04DD15
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