Optical scattering measurements of random anti-reflective nanostructured surfaces in the mid- and long-wave IR

2020 ◽  
Author(s):  
David A. Gonzalez ◽  
Jesus Meza-Galvan ◽  
David Sharp ◽  
Karun Vijayraghavan ◽  
Menelaos K. Poutous
Keyword(s):  
Optical Scattering ◽  
Nanostructured Surfaces ◽  
Long Wave ◽  
Scattering Measurements

Polarized Optical Scattering Measurements of Metallic Nanoparticles on a Thin Film Silicon Wafer

2009 ◽  
Author(s):  
Cheng-Yang Liu ◽  
Tze-An Liu ◽  
Wei-En Fu ◽  
Erik M. Secula ◽  
David G. Seiler ◽  
...  
Keyword(s):  
Thin Film ◽  
Silicon Wafer ◽  
Metallic Nanoparticles ◽  
Optical Scattering ◽  
Thin Film Silicon ◽  
Scattering Measurements

Characterization of Surface Micro-Roughness by Off-Specular Measurements of Polarized Optical Scattering

2019 ◽  
Vol 19 (6) ◽  
pp. 257-263
Author(s):  
Cheng-Yang Liu ◽  
Li-Jen Chang
Keyword(s):  
Surface Roughness ◽  
Light Intensity ◽  
Measurement System ◽  
Light Polarization ◽  
Optical Scattering ◽  
Metal Sheets ◽  
Scattering Measurements ◽  
Stepper Motors ◽  
Laser Sources

Abstract The characterization of surface micro-roughness is investigated by using off-specular measurements of polarized optical scattering. In the measurement system, the detection angles of optical scattering are defined by the vertical and level scattering angles. The rotating mechanism of angles is controlled by stepper motors. Waveplate and polarizer are used to adjust light polarization and detection. We conduct the optical scattering measurements by using four standard metal sheets of surface roughness. The nominal values (Ra) of standard micro-roughness are 1.6 μm, 0.8 μm, 0.4 μm, and 0.1 μm, respectively. Samples with different surface roughness are evaluated with the utilization of laser sources at three incident wavelengths. These polarized images are analyzed using a computer program to obtain the distribution of light intensity. The results show great correlation between the metal surface roughness and polarization states. This measurement system can be used to quickly and accurately distinguish between different surfaces and properties.

scholarly journals Optical scattering measurements and implications on thermal noise in Gravitational Wave detectors test-mass coatings

2018 ◽  
Vol 382 (33) ◽  
pp. 2259-2264 ◽  
Author(s):  
Lamar Glover ◽  
Michael Goff ◽  
Jignesh Patel ◽  
Innocenzo Pinto ◽  
Maria Principe ◽  
...  
Keyword(s):  
Gravitational Wave ◽  
Thermal Noise ◽  
Test Mass ◽  
Optical Scattering ◽  
Scattering Measurements ◽  
Gravitational Wave Detectors
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