Variable angle terahertz reflectance measurement based on fiber-type terahertz time-domain spectrometer

2019 ◽  
Author(s):  
Qing Sun ◽  
Zheng Li ◽  
Meiqi Feng ◽  
Yuqiang Deng ◽  
Liang Shang
Keyword(s):  
Time Domain ◽  
Fiber Type ◽  
Reflectance Measurement ◽  
Variable Angle

Influence of Laser Polarization on Fiber-Type Terahertz Time-Domain Spectrometer

2019 ◽  
Vol 46 (6) ◽  
pp. 0614019
Author(s):  
冯美琦 Meiqi Feng ◽  
孙青 Qing Sun ◽  
邓玉强 Yuqiang Deng ◽  
丁晴 Qing Ding ◽  
李超辰 Chaochen Li ◽  
...  
Keyword(s):  
Time Domain ◽  
Fiber Type ◽  
Laser Polarization

Structural Organization and Distribution of Fiber Types in Extraocular Muscles of Cats

1972 ◽  
Vol 30 ◽  
pp. 34-35
Author(s):  
Asish C. Nag ◽  
Lee D. Peachey
Keyword(s):  
Fiber Type ◽  
Light And Electron Microscopy ◽  
Small Diameter ◽  
Extraocular Muscles ◽  
Fiber Types ◽  
Distinctive Features ◽  
Superior Rectus ◽  
Adult Cats ◽  
Different Diameters ◽  
Orbital Region

Cat extraocular muscles consist of two regions: orbital, and global. The orbital region contains predominantly small diameter fibers, while the global region contains a variety of fibers of different diameters. The differences in ultrastructural features among these muscle fibers indicate that the extraocular muscles of cats contain at least five structurally distinguishable types of fibers.Superior rectus muscles were studied by light and electron microscopy, mapping the distribution of each fiber type with its distinctive features. A mixture of 4% paraformaldehyde and 4% glutaraldehyde was perfused through the carotid arteries of anesthetized adult cats and applied locally to exposed superior rectus muscles during the perfusion.

Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

1995 ◽  
Vol 53 ◽  
pp. 512-513
Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf
Keyword(s):  
Sample Preparation ◽  
Milling Time ◽  
High Density ◽  
Low Density ◽  
Ion Milling ◽  
High Quality ◽  
Variable Angle ◽  
Major Disadvantage ◽  
Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

Time-domain analysis of dispersive transmission lines

1993 ◽  
Vol 3 (3) ◽  
pp. 581-591 ◽  
Author(s):  
Wojciech Gwarek ◽  
Malgorzata Celuch-Marcysiak
Keyword(s):  
Transmission Lines ◽  
Time Domain ◽  
Time Domain Analysis ◽  
Domain Analysis

Apodisation in the time domain

1992 ◽  
Vol 2 (4) ◽  
pp. 615-620
Author(s):  
G. W. Series
Keyword(s):  
Time Domain ◽  
The Time Domain
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