Measurement of the deposition morphology using temporal phase-shifting laser speckle interferometry

Author(s):  
Shuhua Li ◽  
Yuanbo Li ◽  
Xiaoqian Cui ◽  
Ding Wu ◽  
Dongye Zhao ◽  
...  
2003 ◽  
Author(s):  
Pablo D. Ruiz ◽  
Jonathan M. Huntley ◽  
Guillermo H. Kaufmann

2012 ◽  
Vol 6-7 ◽  
pp. 76-81
Author(s):  
Yong Liu ◽  
Ding Fa Huang ◽  
Yong Jiang

Phase-shifting interferometry on structured light projection is widely used in 3-D surface measurement. An investigation shows that least-squares fitting can significantly decrease random error by incorporating data from the intermediate phase values, but it cannot completely eliminate nonlinear error. This paper proposes an error-reduction method based on double three-step phase-shifting algorithm and least-squares fitting, and applies it on the temporal phase unwrapping algorithm using three-frequency heterodyne principle. Theoretical analyses and experiment results show that this method can greatly save data acquisition time and improve the precision.


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