Analysis and suppression of stray radiation in infrared spectral radiation measurement

2019 ◽  
Author(s):  
Shufang He ◽  
Yanfei Wang ◽  
Caihong Dai ◽  
Jinyuan Liu ◽  
Guojin Feng
Keyword(s):  
Radiation Measurement ◽  
Spectral Radiation ◽  
Stray Radiation ◽  
Infrared Spectral

Untersuchungen über die statistischen Schwankungen der infraroten Strahlung einer Hochdruck-Hochstrom-Argonentladung

1965 ◽  
Vol 20 (9) ◽  
pp. 1156-1169 ◽  
Author(s):  
W. Gubler ◽  
M. J. O. Strutt
Keyword(s):  
Infrared Detector ◽  
Photon Radiation ◽  
Continuous Emission ◽  
Spectral Radiation ◽  
Radial Temperature ◽  
Argon Discharge ◽  
Infrared Spectral ◽  
Dc Current ◽  
Spontaneous Fluctuations ◽  
Measured Distribution

An argon discharge at high pressure (up to 20 atmosph.) and large dc current is described. This discharge is used in the investigation of spontaneous fluctuations of photon radiation. Electron and ion densities are calculated as functions of pressure and temperature from which the continuous emission and absorption coefficients are determined. By comparing the calculated emission with the measured distribution of the infrared spectral radiation intensity in a disk of plasma, which is 0,2 mm in front of the cathode, the radial temperature distribution in the disk is determined. The temperature in the arc axis was found to be independent of the gas pressure and must be higher than 28 000°K. Investigations on electrical conductivity confirm the temperature distributions. Finally, the statistical radiation fluctuations can be calculated by means of the equations given in Part I and are compared with the experimental results. The infrared detector used for all these measurements is also described in Part I. A satisfactory coincidence between calculated and measured values was found.

Internal stray radiation measurement for cryogenic infrared imaging systems using a spherical mirror

2017 ◽  
Vol 56 (17) ◽  
pp. 4918 ◽  
Author(s):  
Qijie Tian ◽  
Songtao Chang ◽  
Fengyun He ◽  
Zhou Li ◽  
Yanfeng Qiao
Keyword(s):  
Infrared Imaging ◽  
Imaging Systems ◽  
Spherical Mirror ◽  
Radiation Measurement ◽  
Stray Radiation

Internal Stray Radiation Measurement for Cooled Infrared Imaging Systems Using Ambient Temperature

2017 ◽  
Vol 37 (7) ◽  
pp. 0712002
Author(s):  
田棋杰 Tian Qijie ◽  
常松涛 Chang Songtao ◽  
何锋赟 He Fengyun ◽  
乔彦峰 Qiao Yanfeng
Keyword(s):  
Ambient Temperature ◽  
Infrared Imaging ◽  
Imaging Systems ◽  
Radiation Measurement ◽  
Stray Radiation

scholarly journals Internal stray radiation measurement for cooled infrared imaging systems

2015 ◽  
Vol 64 (5) ◽  
pp. 050702
Author(s):  
Chang Song-Tao ◽  
Sun Zhi-Yuan ◽  
Zhang Yao-Yu ◽  
Zhu Wei
Keyword(s):  
Infrared Imaging ◽  
Imaging Systems ◽  
Radiation Measurement ◽  
Stray Radiation

FR-IR Molecular Microanalysis System

1990 ◽  
Vol 48 (2) ◽  
pp. 270-271
Author(s):  
John A. Reffner ◽  
William T. Wihlborg
Keyword(s):  
Fourier Transform ◽  
Fourier Transform Infrared ◽  
Integrated System ◽  
Morphological Examination ◽  
Fully Integrated ◽  
Ir Microscopy ◽  
Normal Functions ◽  
Infrared Microspectroscopy ◽  
Infrared Spectral ◽  
Ft Ir

The IRμs™ is the first fully integrated system for Fourier transform infrared (FT-IR) microscopy. FT-IR microscopy combines light microscopy for morphological examination with infrared spectroscopy for chemical identification of microscopic samples or domains. Because the IRμs system is a new tool for molecular microanalysis, its optical, mechanical and system design are described to illustrate the state of development of molecular microanalysis. Applications of infrared microspectroscopy are reviewed by Messerschmidt and Harthcock.Infrared spectral analysis of microscopic samples is not a new idea, it dates back to 1949, with the first commercial instrument being offered by Perkin-Elmer Co. Inc. in 1953. These early efforts showed promise but failed the test of practically. It was not until the advances in computer science were applied did infrared microspectroscopy emerge as a useful technique. Microscopes designed as accessories for Fourier transform infrared spectrometers have been commercially available since 1983. These accessory microscopes provide the best means for analytical spectroscopists to analyze microscopic samples, while not interfering with the FT-IR spectrometer’s normal functions.

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