Toward a new sensing platform based on conducting polymer: thickness measurement and the effect of different oxidant solution on damage threshold

2019 ◽  
Author(s):  
Soroush Shahnia ◽  
Junaiz Rehmen ◽  
David G. Lancaster ◽  
Drew Evans ◽  
Shahraam Afshar
Keyword(s):  
Conducting Polymer ◽  
Damage Threshold ◽  
Thickness Measurement ◽  
Sensing Platform ◽  
Polymer Thickness

A novel electrochemical sensing platform for anions based on conducting polymer film modified electrodes integrated on paper-based chips

Talanta ◽  
2013 ◽  
Vol 105 ◽  
pp. 40-45 ◽  
Author(s):  
Baohua Lou ◽  
Chaogui Chen ◽  
Zhixue Zhou ◽  
Lingling Zhang ◽  
Erkang Wang ◽  
...  
Keyword(s):  
Polymer Film ◽  
Conducting Polymer ◽  
Modified Electrodes ◽  
Electrochemical Sensing ◽  
Sensing Platform

The observation of nano-voids in Au thin films

1987 ◽  
Vol 45 ◽  
pp. 366-367
Author(s):  
William Krakow
Keyword(s):  
Thin Films ◽  
Melting Point ◽  
Present Author ◽  
Stacking Faults ◽  
Damage Threshold ◽  
Ionic Species ◽  
Rare Gases ◽  
Chain Defects ◽  
Vacancy Chains ◽  
Au Thin Films

It has long been known that defects such as stacking faults and voids can be quenched from various alloyed metals heated to near their melting point. Today it is common practice to irradiate samples with various ionic species of rare gases which also form voids containing solidified phases of the same atomic species, e.g. ref. 3. Equivalently, electron irradiation has been used to produce damage events, e.g. ref. 4. Generally all of the above mentioned studies have relied on diffraction contrast to observe the defects produced down to a dimension of perhaps 10 to 20Å. Also all these studies have used ions or electrons which exceeded the damage threshold for knockon events. In the case of higher resolution studies the present author has identified vacancy and interstitial type chain defects in ion irradiated Si and was able to identify both di-interstitial and di-vacancy chains running through the foil.

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

Environmental cell studies of deformation and fracture

1990 ◽  
Vol 48 (4) ◽  
pp. 516-517
Author(s):  
H. K. Birnbaum ◽  
I. M. Robertson
Keyword(s):  
National Laboratory ◽  
Argonne National Laboratory ◽  
Damage Threshold ◽  
Chromatic Aberration ◽  
Good Choice ◽  
Point Of View ◽  
Deformation And Fracture ◽  
Environmental Cell ◽  
Gas Molecules ◽  
The University

Studies of the effects of hydrogen environments on the deformation and fracture of fcc, bcc and hep metals and alloys have been carried out in a TEM environmental cell. The initial experiments were performed in the environmental cell of the HVEM facility at Argonne National Laboratory. More recently, a dedicated environmental cell facility has been constructed at the University of Illinois using a JEOL 4000EX and has been used for these studies. In the present paper we will describe the general design features of the JEOL environmental cell and some of the observations we have made on hydrogen effects on deformation and fracture.The JEOL environmental cell is designed to operate at 400 keV and below; in part because of the available accelerating voltage of the microscope and in part because the damage threshold of most materials is below 400 keV. The gas pressure at which chromatic aberration due to electron scattering from the gas molecules becomes excessive does not increase rapidly with with accelerating voltage making 400 keV a good choice from that point of view as well. A series of apertures were placed above and below the cell to control the pressures in various parts of the column.

Intima-media thickness measurement of the carotid artery in patients with primary hyperparathyroidism

2015 ◽  
Author(s):  
Dilek Tuzun ◽  
Ayten Oguz ◽  
Murat Sahin ◽  
Safa Ersen Ganidagli ◽  
Didem Atay ◽  
...  
Keyword(s):  
Carotid Artery ◽  
Primary Hyperparathyroidism ◽  
Intima Media Thickness ◽  
Thickness Measurement ◽  
Media Thickness

Role of Polymer in Enhancement of Conductivity of Proton and Lithium Conducting Polymer Gel Electrolytes

2016 ◽  
Vol 4 (2) ◽  
pp. 1
Author(s):  
KUMAR RAJIV ◽  
SHARMA SHUCHI ◽  
DHIMAN NARESH ◽  
PATHAK DINESH ◽  
◽  
...  
Keyword(s):  
Conducting Polymer ◽  
Polymer Gel ◽  
Gel Electrolytes ◽  
Polymer Gel Electrolytes
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