Effects of different oxygen flow on refractive index and absorption characteristics of Ta2O5 film

Relationship between Oxygen Defects and Properties of Scandium Oxide Films Prepared by Ion-Beam Sputtering

Coatings ◽

10.3390/coatings9080517 ◽

2019 ◽

Vol 9 (8) ◽

pp. 517

Author(s):

Pengfei Kong ◽

Yunti Pu ◽

Ping Ma ◽

Jiliang Zhu

Keyword(s):

Refractive Index ◽

Surface Quality ◽

Flow Rate ◽

Ion Beam ◽

Oxygen Flow Rate ◽

Scandium Oxide ◽

Oxygen Flow ◽

Ion Beam Sputtering ◽

Oxygen Defects ◽

Beam Sputtering

Scandium oxide (Sc2O3) thin films with different numbers of oxygen defects were prepared by ion-beam sputtering under different oxygen flow rates. The results showed that the oxygen defects heavily affected crystal phases, optical properties, laser-induced damage threshold (LIDT) and surface quality of Sc2O3 films. The thin film under 0 standard-state cubic centimeter per minute (sccm) oxygen flow rate had the largest number of oxygen defects, which resulted in the lowest transmittance, LIDT and the worst surface quality. In addition, the refractive index of 0 sccm Sc2O3 film could not be measured in the same way. When the oxygen flow rate was 15 sccm, the Sc2O3 film possessed the best transmittance, refractive index, LIDT and surface roughness due to the lowest number of oxygen defects. This work elucidated the relationship between oxygen defects and properties of Sc2O3 films. Controlling oxygen flow rate was an important step of limiting the number of oxygen defects, which is of great significance for industrial production.

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Refractive index variation of amorphous Ta2O5 film fabricated by ion beam sputtering with RF bias power

Optical Review ◽

10.1007/s10043-009-0051-2 ◽

2009 ◽

Vol 16 (3) ◽

pp. 274-275 ◽

Cited By ~ 2

Author(s):

Chen Yang Huang ◽

Hao Min Ku ◽

Yi Ping Tsai ◽

Wei Kai Chen ◽

Shiuh Chao

Keyword(s):

Refractive Index ◽

Ion Beam ◽

Ion Beam Sputtering ◽

Bias Power ◽

Refractive Index Variation ◽

Ta2o5 Film ◽

Index Variation ◽

Beam Sputtering

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Double-tuned light-absorption characteristics in the attenuated-total-reflection structure containing a metal-clad dielectric-film waveguide with a low-refractive-index buffer layer

Optics Letters ◽

10.1364/ol.6.000392 ◽

1981 ◽

Vol 6 (8) ◽

pp. 392 ◽

Cited By ~ 1

Author(s):

H. Kitajima ◽

K. Fujita

Keyword(s):

Refractive Index ◽

Buffer Layer ◽

Light Absorption ◽

Dielectric Film ◽

Total Reflection ◽

Attenuated Total Reflection ◽

Absorption Characteristics ◽

Low Refractive Index

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Growth of (111) and (200) orientation cubic MgZnO thin films under different oxygen flow rate by PLD method and its difference in element composition and optical absorption characteristics

Materials Research Bulletin ◽

10.1016/j.materresbull.2014.12.054 ◽

2015 ◽

Vol 64 ◽

pp. 76-81 ◽

Cited By ~ 8

Author(s):

S. Han ◽

Y.K. Shao ◽

Y.M. Lu ◽

P.J. Cao ◽

W.J. Liu ◽

...

Keyword(s):

Thin Films ◽

Optical Absorption ◽

Flow Rate ◽

Element Composition ◽

Oxygen Flow Rate ◽

Oxygen Flow ◽

Absorption Characteristics

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TEM characterization of proton-exchanged LiNbO3 optical waveguides

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014395x ◽

1986 ◽

Vol 44 ◽

pp. 480-481

Author(s):

W. E. Lee

Keyword(s):

Refractive Index ◽

Benzoic Acid ◽

Optical Waveguides ◽

Total Internal Reflection ◽

Index Of Refraction ◽

Optical Measurements ◽

Lithium Ions ◽

Wide Channel ◽

Tem Characterization

An optical waveguide consists of a several-micron wide channel with a slightly different index of refraction than the host substrate; light can be trapped in the channel by total internal reflection.Optical waveguides can be formed from single-crystal LiNbO3 using the proton exhange technique. In this technique, polished specimens are masked with polycrystal1ine chromium in such a way as to leave 3-13 μm wide channels. These are held in benzoic acid at 249°C for 5 minutes allowing protons to exchange for lithium ions within the channels causing an increase in the refractive index of the channel and creating the waveguide. Unfortunately, optical measurements often reveal a loss in waveguiding ability up to several weeks after exchange.

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Light microscopy of ceramics

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010015037x ◽

1993 ◽

Vol 51 ◽

pp. 908-909

Author(s):

Walter C. McCrone

Keyword(s):

Refractive Index ◽

Light Microscopy ◽

Light Microscope ◽

Polarized Light ◽

Refractive Indices ◽

Complete Coverage ◽

The Subject ◽

Lower Refractive Index

An excellent chapter on this subject by V.D. Fréchette appeared in a book edited by L.L. Hench and R.W. Gould in 1971 (1). That chapter with the references cited there provides a very complete coverage of the subject. I will add a more complete coverage of an important polarized light microscope (PLM) technique developed more recently (2). Dispersion staining is based on refractive index and its variation with wavelength (dispersion of index). A particle of, say almandite, a garnet, has refractive indices of nF = 1.789 nm, nD = 1.780 nm and nC = 1.775 nm. A Cargille refractive index liquid having nD = 1.780 nm will have nF = 1.810 and nC = 1.768 nm. Almandite grains will disappear in that liquid when observed with a beam of 589 nm light (D-line), but it will have a lower refractive index than that liquid with 486 nm light (F-line), and a higher index than that liquid with 656 nm light (C-line).

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