A shadowing technique to arrest laser-induced damage growth on exit surface silica

Author(s):  
Rajesh N. Raman ◽  
Raminder Garcha ◽  
Michael Rushford ◽  
Gabe Guss ◽  
Wren Carr
2017 ◽  
Vol 42 (24) ◽  
pp. 5078 ◽  
Author(s):  
Matthieu Veinhard ◽  
Odile Bonville ◽  
Roger Courchinoux ◽  
Romain Parreault ◽  
Jean-Yves Natoli ◽  
...  

2014 ◽  
Vol 22 (4) ◽  
pp. 3824 ◽  
Author(s):  
Raluca A. Negres ◽  
David A. Cross ◽  
Zhi M. Liao ◽  
Manyalibo J. Matthews ◽  
Christopher W. Carr

2013 ◽  
Author(s):  
Zhou Fang ◽  
Yuanan Zhao ◽  
Guohang Hu ◽  
Shunli Chen ◽  
Dawei Li ◽  
...  

Author(s):  
Yajing Guo ◽  
Shunxing Tang ◽  
Xiuqing Jiang ◽  
Yujie Peng ◽  
Baoqiang Zhu ◽  
...  

Abstract An effective damage test method based on a marker-based watershed algorithm with gray control (MWGC) is proposed to study the properties of damage induced by near-field laser irradiation for large-aperture laser facilities. Damage tests were performed on fused silica samples and information on the size of damage sites was obtained by this new algorithm, which can effectively suppress the issue of over-segmentation of images resulting from non-uniform illumination in dark-field imaging. Experimental analysis and results show that the lateral damage growth on the exit surface is exponential, and the number of damage sites decreases sharply with damage site size in the damage site distribution statistics. The average damage growth coefficients fitted according to the experimental results for Corning-7980 and Heraeus-Suprasil 312 samples at 351 nm are $\def \xmlpi #1{}\def \mathsfbi #1{\boldsymbol {\mathsf {#1}}}\let \le =\leqslant \let \leq =\leqslant \let \ge =\geqslant \let \geq =\geqslant \def \Pr {\mathit {Pr}}\def \Fr {\mathit {Fr}}\def \Rey {\mathit {Re}}1.10 \pm 0.31$ and $0.60 \pm 0.09$ , respectively.


2015 ◽  
Author(s):  
Stavros G. Demos ◽  
Raluca A. Negres ◽  
Rajesh N. Raman ◽  
Michael D. Feit ◽  
Kenneth R. Manes ◽  
...  

2022 ◽  
Vol 32 ◽  
pp. 105094
Author(s):  
Chengyu Zhu ◽  
Lingxi Liang ◽  
Ge Peng ◽  
Hang Yuan ◽  
Luoxian Zhou ◽  
...  

Author(s):  
Matthieu Veinhard ◽  
Laurent Lamaignère ◽  
Odile Bonville ◽  
Roger Courchinoux ◽  
Romain Parreault ◽  
...  

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