Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems

2019 ◽  
Author(s):  
Bastian Schwarz ◽  
Michael Koerber ◽  
Gunnar Ritt ◽  
Bernd Eberle
Keyword(s):  
Optomechanical Systems ◽  
Laser Induced Damage ◽  
Camera Sensors

scholarly journals Laser-induced damage threshold of camera sensors and micro-optoelectromechanical systems

2017 ◽  
Vol 56 (3) ◽  
pp. 034108 ◽  
Author(s):  
Bastian Schwarz ◽  
Gunnar Ritt ◽  
Michael Koerber ◽  
Bernd Eberle
Keyword(s):  
Damage Threshold ◽  
Laser Induced Damage ◽  
Camera Sensors

UHV-TEM studies of laser-induced damage

1991 ◽  
Vol 49 ◽  
pp. 632-633
Author(s):  
T.S. Savage ◽  
R. Ai ◽  
D. Dunn ◽  
L.D. Marks
Keyword(s):  
Surface Science ◽  
Rapid Heating ◽  
Local Heating ◽  
Routine Practice ◽  
Transmission Electron ◽  
Northwestern University ◽  
Laser Induced Damage ◽  
Set Up ◽  
Focusing Lens ◽  
Diffusion Of Impurities

The use of lasers for surface annealing, heating and/or damage has become a routine practice in the study of materials. Lasers have been closely looked at as an annealing technique for silicon and other semiconductors. They allow for local heating from a beam which can be focused and tuned to different wavelengths for specific tasks. Pulsed dye lasers allow for short, quick bursts which can allow the sample to be rapidly heated and quenched. This short, rapid heating period may be important for cases where diffusion of impurities or dopants may not be desirable.At Northwestern University, a Candela SLL - 250 pulsed dye laser, with a maximum power of 1 Joule/pulse over 350 - 400 nanoseconds, has been set up in conjunction with a Hitachi UHV-H9000 transmission electron microscope. The laser beam is introduced into the surface science chamber through a series of mirrors, a focusing lens and a six inch quartz window.

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