Slope error correction of bendable gratings with an in-situ long trace profiler for the soft x-ray beamline at National Synchrotron Radiation Research Center (NSRRC) (Conference Presentation)

2019 ◽  
Author(s):  
Shang-Wei Lin ◽  
Duan-Jen Wang ◽  
Chih-Yu Hua ◽  
Hok-Sum Fung ◽  
Ming-Ying Hsu ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Error Correction ◽  
Research Center ◽  
X Ray ◽  
Slope Error ◽  
Radiation Research

Development of a long trace profiler in situ at National Synchrotron Radiation Research Center

2019 ◽  
Vol 90 (2) ◽  
pp. 021716 ◽  
Author(s):  
Shang-Wei Lin ◽  
Duan-Jen Wang ◽  
Huang-Wen Fu ◽  
Huang-Ming Tsai ◽  
Chih-Yu Hua ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Research Center ◽  
Radiation Research

Wiggler x‐ray beamlines at Synchrotron Radiation Research Center

1995 ◽  
Vol 66 (2) ◽  
pp. 1812-1814 ◽  
Author(s):  
K.‐L. Tsang ◽  
C.‐H. Lee ◽  
Y.‐C. Jean ◽  
T.‐E. Dann ◽  
J.‐R. Chen ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Research Center ◽  
X Ray ◽  
Radiation Research

scholarly journals Two-dimensionalin situmetrology of X-ray mirrors using the speckle scanning technique

2015 ◽  
Vol 22 (4) ◽  
pp. 925-929 ◽  
Author(s):  
Hongchang Wang ◽  
Yogesh Kashyap ◽  
David Laundy ◽  
Kawal Sawhney
Keyword(s):  
Synchrotron Radiation ◽  
Geometrical Optics ◽  
Two Dimensional ◽  
Response Functions ◽  
Beam Size ◽  
X Ray ◽  
Novel Technique ◽  
Slope Error ◽  
Focused Beam

In situmetrology overcomes many of the limitations of existing metrology techniques and is capable of exceeding the performance of present-day optics. A novel technique for precisely characterizing an X-ray bimorph mirror and deducing its two-dimensional (2D) slope error map is presented. This technique has also been used to perform fast optimization of a bimorph mirror using the derived 2D piezo response functions. The measured focused beam size was significantly reduced after the optimization, and the slope error map was then verified by using geometrical optics to simulate the focused beam profile. This proposed technique is expected to be valuable forin situmetrology of X-ray mirrors at synchrotron radiation facilities and in astronomical telescopes.

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Machine Learning Powered by Principal Component Descriptors as the Key for Sorted Structural Fit of XANES

2021 ◽  
Author(s):  
Andrea Martini ◽  
Alexander A. Guda ◽  
Sergey A. Guda ◽  
Aram L. Bugaev ◽  
Olga V. Safonova ◽  
...  
Keyword(s):  
Machine Learning ◽  
Structural Analysis ◽  
Synchrotron Radiation ◽  
Free Electron Laser ◽  
Principal Component ◽  
Analytical Tool ◽  
X Ray ◽  
Radiation Sources ◽  
X Ray Absorption

Modern synchrotron radiation sources and free electron laser made X-ray absorption spectroscopy (XAS) an analytical tool for the structural analysis of materials under in situ or operando conditions. Fourier approach...

scholarly journals Synchrotron radiation microbeam X-ray fluorescence analysis of zinc concentration in remineralized enamel in situ

2009 ◽  
Vol 54 (5) ◽  
pp. 420-423 ◽  
Author(s):  
Tsunenori Matsunaga ◽  
Hidetaka Ishizaki ◽  
Shuji Tanabe ◽  
Yoshihiko Hayashi
Keyword(s):  
Synchrotron Radiation ◽  
Zinc Concentration ◽  
Fluorescence Analysis ◽  
X Ray
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