Investigation of the dynamic fragmentation process in ceramics by using ultra-high speed x-ray imaging with synchrotron radiation

2019 ◽  
Author(s):  
Daniel Eakins ◽  
Alexander Rack ◽  
Pascal Forquin ◽  
Bratislav Lukic ◽  
Yannick Duplan ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
High Speed ◽  
Fragmentation Process ◽  
X Ray ◽  
Dynamic Fragmentation ◽  
Ultra High Speed ◽  
X Ray Imaging

scholarly journals Ultra-high-speed x-ray imaging of shock-induced cavity collapse in a solid medium

2020 ◽  
Author(s):  
Emilio M. Escauriza ◽  
Joao P. Duarte ◽  
David J. Chapman ◽  
Lukasz Farbaniec ◽  
John C. Jonsson ◽  
...  
Keyword(s):  
High Speed ◽  
Solid Medium ◽  
X Ray ◽  
Cavity Collapse ◽  
Ultra High Speed ◽  
X Ray Imaging

scholarly journals Ultra-high speed X-ray imaging of dynamic fracturing in cementitious materials under impact

2021 ◽  
Vol 250 ◽  
pp. 01014
Author(s):  
Bratislav Lukić ◽  
Maria Blasone ◽  
Yannick Duplan ◽  
Pascal Forquin ◽  
Emilio Escauriza ◽  
...  
Keyword(s):  
High Speed ◽  
High Strength ◽  
Cementitious Materials ◽  
Test Configuration ◽  
X Ray ◽  
Ultra High Speed ◽  
X Ray Imaging ◽  
Two Samples ◽  
Fragmentation Patterns ◽  
Dynamic Fracturing

In this work the dynamic fracturing of an ultra-high strength cementitious material is probed with in-situ ultra-high speed X-ray phase-contrast diagnostics to investigate the phenomenology of dynamic fracture. Gas gun experiments were conducted on two characteristic samples with two different impact speeds, namely 80 and 190 m/s using the edge-on impact test configuration. The samples were placed within the intense X-ray beam providing an observation field of 12.8 mm in width and 8 mm in height. Thanks to equispaced 16 bunches of short X-ray pulses, the samples were imaged through an indirect detector arrangement using the Shimadzu HPV-X2 camera lens-coupled to a fast scintillator capturing through-thickness measurements with an interframe time of 1.06 µs. The comparison of fragmentation patterns between two samples revealed an important insight into velocity dependant spall formation as well as the effects of crack closure and bridging.

scholarly journals Ultra-high-speed indirect x-ray imaging system with versatile spatiotemporal sampling capabilities

2018 ◽  
Vol 57 (18) ◽  
pp. 5004 ◽  
Author(s):  
Emilio M. Escauriza ◽  
Margie P. Olbinado ◽  
Michael E. Rutherford ◽  
David J. Chapman ◽  
John C. Z. Jonsson ◽  
...  
Keyword(s):  
High Speed ◽  
Imaging System ◽  
X Ray ◽  
Ultra High Speed ◽  
X Ray Imaging

scholarly journals Ultra high-speed x-ray imaging of laser-driven shock compression using synchrotron light

2018 ◽  
Vol 51 (5) ◽  
pp. 055601 ◽  
Author(s):  
Margie P Olbinado ◽  
Valentina Cantelli ◽  
Olivier Mathon ◽  
Sakura Pascarelli ◽  
Joerg Grenzer ◽  
...  
Keyword(s):  
Shock Compression ◽  
High Speed ◽  
X Ray ◽  
Ultra High Speed ◽  
X Ray Imaging ◽  
Synchrotron Light

Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light

2018 ◽  
Vol 13 (04) ◽  
pp. C04004-C04004 ◽  
Author(s):  
M.P. Olbinado ◽  
J. Grenzer ◽  
P. Pradel ◽  
T. De Resseguier ◽  
P. Vagovic ◽  
...  
Keyword(s):  
High Speed ◽  
X Ray ◽  
Ultra High Speed ◽  
X Ray Imaging ◽  
Synchrotron Light

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

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