Polish contribution to final beam dynamic calculations for accelerator system analysis in the Early Neutron Source project

2019 ◽  
Author(s):  
Wojciech Grabowski ◽  
Konrad Kosiński ◽  
Mieszko Maćkowski ◽  
Marcin Staszczak ◽  
Anna Wysocka-Rabin ◽  
...  
Keyword(s):  
Neutron Source ◽  
System Analysis ◽  
Beam Dynamic ◽  
Accelerator System

Design of compact accelerator system for high flux accelerator based neutron source

2020 ◽  
Vol 91 (2) ◽  
pp. 023323
Author(s):  
Jungbae Bahng ◽  
Byoung-Seob Lee ◽  
Eun-San Kim ◽  
Seong Hee Park ◽  
Hyang-Kyu Park
Keyword(s):  
Neutron Source ◽  
High Flux ◽  
Accelerator System

Intensity Stability Dmprovements for the Intense Pulsed Neutron Source Accelerator System

1985 ◽  
Vol 32 (5) ◽  
pp. 2126-2128
Author(s):  
A. Rauchas ◽  
G. Gunderson ◽  
V. Stipp ◽  
G. Volk ◽  
R. Zolecki
Keyword(s):  
Neutron Source ◽  
Pulsed Neutron ◽  
Pulsed Neutron Source ◽  
Accelerator System

scholarly journals Performance of the Intense Pulsed Neutron Source Accelerator System

1983 ◽  
Vol 30 (4) ◽  
pp. 2131-2133 ◽  
Author(s):  
C. Potts ◽  
F. Brumwell ◽  
A. Rauchas ◽  
V. Stipp ◽  
G. Volk
Keyword(s):  
Neutron Source ◽  
Pulsed Neutron ◽  
Pulsed Neutron Source ◽  
Accelerator System

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

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